International audienceContent-addressable memories (CAMs) enable the comparison of their entire content to a search word in one single access. Ternary CAMs (TCAMs) provide the possibility to store and handle not only 0 s and 1 s but also don't cares. A way to protect TCAMs implemented with static random-access memory (SRAM) cells against soft-errors is proposed. Asymmetric SRAM cells are used to reduce the probability that soft-errors (a) affect don't cares and (b) corrupt 0 s and 1 s into anything else than a don't care. This implies that soft-errors will only have the tendency to generate false-hits that point to an erroneous matching word. Such a failure can be mitigated with the help of an error-correcting code (ECC), as is the case wit...
(c) 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for...
As emerging memories are utilized in processors as main memory, they must also coexist with CMOS mem...
In this talk we investigate a number of on-chip coding techniques for the protection of Random Acce...
International audienceContent-addressable memories (CAMs) enable the comparison of their entire cont...
Soft Errors are becoming a major concern for modern computing systems. Memories are one of the eleme...
International audienceThis paper presents an innovative approach to detect soft errors in Ternary Co...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
This paper presents an innovative approach to detect soft errors in Ternary Content Addressable Memo...
Ternary content addressable memory (TCAM) is more susceptible to soft errors than static random acce...
A content addressable memory (CAM) is an SRAM-based memory that can be accessed in parallel to searc...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Reliability is a major concern for memories. To en- sure that errors do not affect the data stored i...
Soft error in static random-access memory (SRAM) caused by radiation has been shown to be one of the...
Multiple cell upsets (MCUs) become more and more problematic as the size of technology reaches or go...
(c) 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for...
As emerging memories are utilized in processors as main memory, they must also coexist with CMOS mem...
In this talk we investigate a number of on-chip coding techniques for the protection of Random Acce...
International audienceContent-addressable memories (CAMs) enable the comparison of their entire cont...
Soft Errors are becoming a major concern for modern computing systems. Memories are one of the eleme...
International audienceThis paper presents an innovative approach to detect soft errors in Ternary Co...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
This paper presents an innovative approach to detect soft errors in Ternary Content Addressable Memo...
Ternary content addressable memory (TCAM) is more susceptible to soft errors than static random acce...
A content addressable memory (CAM) is an SRAM-based memory that can be accessed in parallel to searc...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
Reliability is a major concern for memories. To en- sure that errors do not affect the data stored i...
Soft error in static random-access memory (SRAM) caused by radiation has been shown to be one of the...
Multiple cell upsets (MCUs) become more and more problematic as the size of technology reaches or go...
(c) 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for...
As emerging memories are utilized in processors as main memory, they must also coexist with CMOS mem...
In this talk we investigate a number of on-chip coding techniques for the protection of Random Acce...