Add to ORKGInternational audienceThis paper presents an innovative approach to detect soft errors in Ternary Content Addressable Memories (TCAMs) based on the use of Bloom Filters. The proposed approach is described in detail and its performance results are presented. The advantages of the proposed method are that no modifications to the TCAM device are required, the checking is done on-line and the approach has low power and area overheads
Abstract — Ternary content addressable memory (TCAM) is one key component in the dedicated hardware ...
[[abstract]]We present an error catch and analysis (ECA) system for semiconductor memories. The syst...
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ...
This paper presents an innovative approach to detect soft errors in Ternary Content Addressable Memo...
A content addressable memory (CAM) is an SRAM-based memory that can be accessed in parallel to searc...
International audienceContent-addressable memories (CAMs) enable the comparison of their entire cont...
Soft Errors are becoming a major concern for modern computing systems. Memories are one of the eleme...
Bloom filters are used in many computing and networking applications where they provide a simple met...
Content addressable memories (CAMs) are very attractive for high-speed table lookups in modern netwo...
Abstract—Ternary content addressable memories (TCAMs) are attractive for applications such as packet...
Bloom filters (BFs) provide a fast and efficient way to check whether a given element belongs to a s...
[[abstract]]Embedded content addressable memories (CAMs) are important components in many system chi...
[[abstract]]© 2003 Springer Verlag - Embedded content addressable memories (CAMs) are important comp...
content addressable memory (CAM) employing a new algorithm for associativity between the input tag a...
Abstract — This paper presents a high-speed and low-energy match line (ML) sensing scheme for ternar...
Abstract — Ternary content addressable memory (TCAM) is one key component in the dedicated hardware ...
[[abstract]]We present an error catch and analysis (ECA) system for semiconductor memories. The syst...
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ...
This paper presents an innovative approach to detect soft errors in Ternary Content Addressable Memo...
A content addressable memory (CAM) is an SRAM-based memory that can be accessed in parallel to searc...
International audienceContent-addressable memories (CAMs) enable the comparison of their entire cont...
Soft Errors are becoming a major concern for modern computing systems. Memories are one of the eleme...
Bloom filters are used in many computing and networking applications where they provide a simple met...
Content addressable memories (CAMs) are very attractive for high-speed table lookups in modern netwo...
Abstract—Ternary content addressable memories (TCAMs) are attractive for applications such as packet...
Bloom filters (BFs) provide a fast and efficient way to check whether a given element belongs to a s...
[[abstract]]Embedded content addressable memories (CAMs) are important components in many system chi...
[[abstract]]© 2003 Springer Verlag - Embedded content addressable memories (CAMs) are important comp...
content addressable memory (CAM) employing a new algorithm for associativity between the input tag a...
Abstract — This paper presents a high-speed and low-energy match line (ML) sensing scheme for ternar...
Abstract — Ternary content addressable memory (TCAM) is one key component in the dedicated hardware ...
[[abstract]]We present an error catch and analysis (ECA) system for semiconductor memories. The syst...
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ...