Verification of the cache hierarchy in modern SoCs due to the large state space requires a huge amount of complex tests. To cover the entire state space of the cache memory hierarchy graph model is proposed. The generation of tests based on this model, whose vertices (V) are the set of states (tags, values, etc.) of each cache and the edges (E) are the many transitions between states (instructions for reading, writing). Thus a graph model is constructed that describes all the states of the cache memory hierarchy. Each edge in the graph is a separate verification sequence. Vector-block operation with memory is provided. The approach described in the paper showed a good result when checking the hierarchy of the multiport cache memory of the d...
Linear digital signal processors, commonly implemented using silicon compilers in bit-serial archite...
In this paper we show that statistical properties of the transition graph of a system to be verified...
Abstract—System functional testing of microprocessors deals with many assembly programs of given beh...
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip cache...
This paper addresses test generation for design verification of pipelined microprocessors. We descri...
International audienceIn this paper we report about a case study on the functional verification of a...
Formal verification is proposed to ensure the correctness of the design and make functional verifica...
the system using test programs executed by the PU. These test programs are often generated by advanc...
Modern microarchitectures employ memory hierarchies involving one or more levels of cache memory to ...
hierarchical evaluation, automatic design, embedded system, cache simulation, cache modeling © Copyr...
The contribution of this thesis is to design and implement safety-critical mechanisms applicable to ...
This dissertation investigates a hierarchical approach to test generation for digital circuits, base...
The traditional approaches to test generation made use of the gate level representation of the circu...
Cache simulation is a potentially complex and time consuming task in the field of computer architect...
In order to reduce software complexity and be power efficient, hardware platforms are increasingly i...
Linear digital signal processors, commonly implemented using silicon compilers in bit-serial archite...
In this paper we show that statistical properties of the transition graph of a system to be verified...
Abstract—System functional testing of microprocessors deals with many assembly programs of given beh...
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip cache...
This paper addresses test generation for design verification of pipelined microprocessors. We descri...
International audienceIn this paper we report about a case study on the functional verification of a...
Formal verification is proposed to ensure the correctness of the design and make functional verifica...
the system using test programs executed by the PU. These test programs are often generated by advanc...
Modern microarchitectures employ memory hierarchies involving one or more levels of cache memory to ...
hierarchical evaluation, automatic design, embedded system, cache simulation, cache modeling © Copyr...
The contribution of this thesis is to design and implement safety-critical mechanisms applicable to ...
This dissertation investigates a hierarchical approach to test generation for digital circuits, base...
The traditional approaches to test generation made use of the gate level representation of the circu...
Cache simulation is a potentially complex and time consuming task in the field of computer architect...
In order to reduce software complexity and be power efficient, hardware platforms are increasingly i...
Linear digital signal processors, commonly implemented using silicon compilers in bit-serial archite...
In this paper we show that statistical properties of the transition graph of a system to be verified...
Abstract—System functional testing of microprocessors deals with many assembly programs of given beh...