Verifying correctness is a major bottleneck in today’s circuit and system design. Verification includes the tasks of error detection, error localization, and error correction in an implemented design, as well as the analysis and avoidance of transient faults. For all those tasks, knowing when an assignment to signals becomes observable at the outputs and for how long it influences the system is important. In this letter, we propose a minimal and maximal latency measure for sequential circuits. This measure explains how long a circuit’s state and outputs depend on input stimuli. Exact and heuristic algorithms are discussed to determine the measure. We evaluate the algorithms on state-of-the-art designs. Experimental results show how t...
Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several ap...
This paper applies model checker-based testing, a well-known method from software engineering, to th...
Estimation of the delay of a Boolean function from its functional description is an important step t...
ISBN: 3540603859We present a new diagnostic algorithm for localising design errors in sequential cir...
The design of state-of-the-art digital circuits often involves interacting state machines with very ...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
This paper proposes a technique for creating a combinational logic network with an output that signa...
Bounds on test sequence length can be used as a testability measure. We give a procedure to compute ...
Accurate timing information of circuits is essential for high quality designs. This paper presents a...
Accurate timing information of circuits is essential for high quality designs. This paper presents a...
(Emerhentall CPU sec. Bounds on test sequence length can be used as a testability measure. We give a...
Abstract | It is known that the clock-period in a sequential circuit can be shorter than the maximum...
Bounds on test sequence length can be used as a testability measure. We give a procedure to compute ...
Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several ap...
This paper applies model checker-based testing, a well-known method from software engineering, to th...
Estimation of the delay of a Boolean function from its functional description is an important step t...
ISBN: 3540603859We present a new diagnostic algorithm for localising design errors in sequential cir...
The design of state-of-the-art digital circuits often involves interacting state machines with very ...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
This paper proposes a technique for creating a combinational logic network with an output that signa...
Bounds on test sequence length can be used as a testability measure. We give a procedure to compute ...
Accurate timing information of circuits is essential for high quality designs. This paper presents a...
Accurate timing information of circuits is essential for high quality designs. This paper presents a...
(Emerhentall CPU sec. Bounds on test sequence length can be used as a testability measure. We give a...
Abstract | It is known that the clock-period in a sequential circuit can be shorter than the maximum...
Bounds on test sequence length can be used as a testability measure. We give a procedure to compute ...
Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several ap...
This paper applies model checker-based testing, a well-known method from software engineering, to th...
Estimation of the delay of a Boolean function from its functional description is an important step t...