Add to ORKG(Emerhentall CPU sec. Bounds on test sequence length can be used as a testability measure. We give a procedure to com-pute the upper bound on test sequence length for an arbitrary sequential circuit. We prove that the bound is exact for a certain class of circuits. Three design rules are specified to yield circuits with lower test sequence bounds.
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
We propose a non-scan design-for-testability (DFT) method to increase the testability of synchronous...
Testing systems-on-a-chip (SOC) involves applying huge amounts of test data, which is stored in the ...
Bounds on test sequence length can be used as a testability measure. We give a procedure to compute ...
Bounds on test sequence length can be used as a testability measure. We give a procedure to compute ...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Several classes of sequential circuits with combinational test generation complexity have been intro...
Several classes of sequential circuits with combinational test generation complexity have been intro...
poses a difficult problem for circuits implemented from finite-state ma-chines. The flip-flops in se...
We present a procedure to generate short test sequences for syn-chronous sequential circuits describ...
Based on τk notation, the test generation complexity of several existing classes of sequential circu...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
We propose a non-scan design-for-testability (DFT) method to increase the testability of synchronous...
Testing systems-on-a-chip (SOC) involves applying huge amounts of test data, which is stored in the ...
Bounds on test sequence length can be used as a testability measure. We give a procedure to compute ...
Bounds on test sequence length can be used as a testability measure. We give a procedure to compute ...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Several classes of sequential circuits with combinational test generation complexity have been intro...
Several classes of sequential circuits with combinational test generation complexity have been intro...
poses a difficult problem for circuits implemented from finite-state ma-chines. The flip-flops in se...
We present a procedure to generate short test sequences for syn-chronous sequential circuits describ...
Based on τk notation, the test generation complexity of several existing classes of sequential circu...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
This paper introduces a new class of sequential circuits called acyclically testable sequential circ...
We propose a non-scan design-for-testability (DFT) method to increase the testability of synchronous...
Testing systems-on-a-chip (SOC) involves applying huge amounts of test data, which is stored in the ...