ISBN: 3540603859We present a new diagnostic algorithm for localising design errors in sequential circuits. The specification and the implementation may have different number of state variables, and different state encoding. The algorithm is based on the new concept of possible next states describing the possible states of the circuit due to the existence of the error. Results obtained on benchmark circuits show that the error is always found, with an execution time proportional to the product of the circuit size, and the length of the test sequences used
Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several ap...
With the increase in the complexity of VLSI circuit design, logic design errors can occur during syn...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
This paper addresses the problem of locating design errors in a sequential circuit. For single-error...
. We present a new diagnostic algorithm, based on backward-propagation, for localising design errors...
International audienceThis paper presents a logic diagnosis approach targeting sequential circuit pe...
International audienceThis paper presents a logic diagnosis approach targeting sequential circuit pe...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0923-8174We present a new diagnost...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
ISBN: 0792377311We describe a new method for design error diagnosis in digital circuits that does no...
Automatic diagnosis of design errors is an important problem in digital circuits CAD. Although autom...
This paper describes a diagnosis technique for locating design errors in circuit implementations whi...
International audienceA new approach to detecting and localizing single gate design errors in combin...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 1406-0175We propose a new approach...
Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several ap...
With the increase in the complexity of VLSI circuit design, logic design errors can occur during syn...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
This paper addresses the problem of locating design errors in a sequential circuit. For single-error...
. We present a new diagnostic algorithm, based on backward-propagation, for localising design errors...
International audienceThis paper presents a logic diagnosis approach targeting sequential circuit pe...
International audienceThis paper presents a logic diagnosis approach targeting sequential circuit pe...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0923-8174We present a new diagnost...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
ISBN: 0792377311We describe a new method for design error diagnosis in digital circuits that does no...
Automatic diagnosis of design errors is an important problem in digital circuits CAD. Although autom...
This paper describes a diagnosis technique for locating design errors in circuit implementations whi...
International audienceA new approach to detecting and localizing single gate design errors in combin...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 1406-0175We propose a new approach...
Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several ap...
With the increase in the complexity of VLSI circuit design, logic design errors can occur during syn...
[[abstract]]This paper addresses the problem of locating error sources in an erroneous combinational...