On the Combined Use of HLDDs and EFSMs for Functional ATPG ∗

This paper describes a functional test pattern generator which exploits two different paradigms: high-level decision diagrams (HLDDs) and extended finite state machines (EFSMs). HLDDs and EFSMs are deterministically explored by using propagation, justification, learning and backjumping. The integration of such strategies allows the ATPG to more efficiently analyze the state space of the design under verification and to generate very effective test sequences.