Previous work has shown that using only simple behavior based error detection mechanisms invisible to the programmer (e.g. memory protection) the percentage of fail-silent violations can be higher than 10%. Since the study of these errors has shown that they were mostly pure data errors, in this paper we evaluate the effectiveness of software techniques checking the semantics of the data such as ABFT and Assertions to detect these remaining errors. The results of injecting physical pin-level faults show that these tests can prevent about 40 % of the fail-silent model violations that have escaped to the simple hardware-based error detection techniques. Moreover, the analysis of the remaining errors has shown that most of them remained undete...
Software-based methods for the detection of control-flow errors caused by transient fault usually co...
An important aspect in the development of dependable software is to decide where to locate mechanism...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
Fault injection campaigns have been used extensively to characterize the behavior of systems under e...
In this paper the behavior of assertion-based error detection mechanisms is characterized under faul...
This paper introduces SymPLFIED, a program-level framework which allows specification of arbitrary e...
In this paper, we revisit traditional checkpointing and rollback recovery strategies, with a focus o...
Abstract—As silicon technology continues to scale down and validation expenses continue to increase,...
International audienceThis paper presents two error models to evaluate safety of a software error de...
The improvement of dependability in computing systems requires the evaluation of fault tolerance mec...
Analyzing the executions of a buggy program is essentially a data mining process: Tracing the data g...
This thesis addresses three important steps in the selection of error detection mechanisms for micro...
As semiconductor technology scales into the deep submicron regime the occurrence of transient or sof...
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...
Software verification encompasses a wide range of techniques and activities that are geared towards ...
Software-based methods for the detection of control-flow errors caused by transient fault usually co...
An important aspect in the development of dependable software is to decide where to locate mechanism...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
Fault injection campaigns have been used extensively to characterize the behavior of systems under e...
In this paper the behavior of assertion-based error detection mechanisms is characterized under faul...
This paper introduces SymPLFIED, a program-level framework which allows specification of arbitrary e...
In this paper, we revisit traditional checkpointing and rollback recovery strategies, with a focus o...
Abstract—As silicon technology continues to scale down and validation expenses continue to increase,...
International audienceThis paper presents two error models to evaluate safety of a software error de...
The improvement of dependability in computing systems requires the evaluation of fault tolerance mec...
Analyzing the executions of a buggy program is essentially a data mining process: Tracing the data g...
This thesis addresses three important steps in the selection of error detection mechanisms for micro...
As semiconductor technology scales into the deep submicron regime the occurrence of transient or sof...
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...
Software verification encompasses a wide range of techniques and activities that are geared towards ...
Software-based methods for the detection of control-flow errors caused by transient fault usually co...
An important aspect in the development of dependable software is to decide where to locate mechanism...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...