In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample interactions which generate many harmonics. When a higher harmonic is close to the natural frequency of a mode, the harmonic signal is enhanced by a resonance. The step-like cantilever is proposed as an effective design to enhance the higher harmonic signals. The natural frequencies are changed with the variations of the step-like cantilever sizes. By carefully designing the step-like cantilever, the first three modes can be simultaneously excited. A comprehensive map is provided as a guidance of selecting the appropriate geometric parameters. (C) 2018 Author(s).</p
The detection of higher modes of oscillation in atomic force microscopy can provide additional info...
Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is seemingl...
We present a micromachined scanning probe cantilever, in which a specific higher order flexural mode...
In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample interactio...
Tapping mode (TM) AFM is a popularly used AFM technique in which an oscillating sharp tip mounted on...
We describe an atomic force microscope cantilever design for which the second flexural mode frequenc...
The natural frequencies of a cantilever probe can be tuned with an attached concentrated mass to coi...
The Atomic Force Microscope (AFM) is a versatile tool for studying and characterizing materials at t...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
A method to enhance the harmonics of tapping mode atomic force microscopy is proposed in this study ...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
We report a new design concept of micromechanical cantilever system incorporating the 1/3 internal r...
In tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmo...
The experimental characterisation of a set of microcantilevers targeted at use in multi-frequency at...
The detection of higher modes of oscillation in atomic force microscopy can provide additional info...
Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is seemingl...
We present a micromachined scanning probe cantilever, in which a specific higher order flexural mode...
In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample interactio...
Tapping mode (TM) AFM is a popularly used AFM technique in which an oscillating sharp tip mounted on...
We describe an atomic force microscope cantilever design for which the second flexural mode frequenc...
The natural frequencies of a cantilever probe can be tuned with an attached concentrated mass to coi...
The Atomic Force Microscope (AFM) is a versatile tool for studying and characterizing materials at t...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
A method to enhance the harmonics of tapping mode atomic force microscopy is proposed in this study ...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
We report a new design concept of micromechanical cantilever system incorporating the 1/3 internal r...
In tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmo...
The experimental characterisation of a set of microcantilevers targeted at use in multi-frequency at...
The detection of higher modes of oscillation in atomic force microscopy can provide additional info...
Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is seemingl...
We present a micromachined scanning probe cantilever, in which a specific higher order flexural mode...