In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample interactions which generate many harmonics. When a higher harmonic is close to the natural frequency of a mode, the harmonic signal is enhanced by a resonance. The step-like cantilever is proposed as an effective design to enhance the higher harmonic signals. The natural frequencies are changed with the variations of the step-like cantilever sizes. By carefully designing the step-like cantilever, the first three modes can be simultaneously excited. A comprehensive map is provided as a guidance of selecting the appropriate geometric parameters
We present a micromachined scanning probe cantilever, in which a specific higher order flexural mode...
The detection of higher modes of oscillation in atomic force microscopy can provide additional info...
Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging and sensin...
In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample interactio...
We describe an atomic force microscope cantilever design for which the second flexural mode frequenc...
The natural frequencies of a cantilever probe can be tuned with an attached concentrated mass to coi...
Tapping mode (TM) AFM is a popularly used AFM technique in which an oscillating sharp tip mounted on...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
The Atomic Force Microscope (AFM) is a versatile tool for studying and characterizing materials at t...
We report a new design concept of micromechanical cantilever system incorporating the 1/3 internal r...
The experimental characterisation of a set of microcantilevers targeted at use in multi-frequency at...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
A method to enhance the harmonics of tapping mode atomic force microscopy is proposed in this study ...
In tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmo...
We present a micromachined scanning probe cantilever, in which a specific higher order flexural mode...
The detection of higher modes of oscillation in atomic force microscopy can provide additional info...
Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging and sensin...
In atomic force microscopy (AFM), the higher modes are highly sensitive to the tip-sample interactio...
We describe an atomic force microscope cantilever design for which the second flexural mode frequenc...
The natural frequencies of a cantilever probe can be tuned with an attached concentrated mass to coi...
Tapping mode (TM) AFM is a popularly used AFM technique in which an oscillating sharp tip mounted on...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
The Atomic Force Microscope (AFM) is a versatile tool for studying and characterizing materials at t...
We report a new design concept of micromechanical cantilever system incorporating the 1/3 internal r...
The experimental characterisation of a set of microcantilevers targeted at use in multi-frequency at...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
A method to enhance the harmonics of tapping mode atomic force microscopy is proposed in this study ...
In tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmo...
We present a micromachined scanning probe cantilever, in which a specific higher order flexural mode...
The detection of higher modes of oscillation in atomic force microscopy can provide additional info...
Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging and sensin...