Microprocessors are extremely versatile and complexity that present significantly test challenges. This paper describes a retargetable functional test platform system design for various microprocessors. Characterized by configurable test environment generator retargetable assembler and strong ATPG, the platform system could automatically produce different test environment and assemble out relative test codes to adapt to the microprocessor under test. Experiments show that the platform system works correctly, flexibly and efficiently.http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000189157300082&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720...
Includes bibliographical references (pages 50-51)This paper investigates the feasibility and effecti...
This paper describes the design-for-testability (DFT) features and test challenges in a general purp...
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended...
In this paper we present a design of a reusable test platform for microprocessors. This platform cou...
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. ...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
Summarization: This paper presents the design and implementation of software for creating test patte...
This paper describes μGP, an evolutionary approach for generating assembly programs tuned for a spe...
In manufacturing testing, functional tests are known to detect unique defects that structural tests ...
Presents an automatic generation system for behavioral test programs of microprocessors. First, the ...
This chapter describes and analyzes a methodology for gathering together test-programs for microproc...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
Includes bibliographical references (page 91)This project presents a Microprocessor System for Autom...
Microprocessor testing is becoming a challenging task, due to the increasing complexity of modern ar...
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach...
Includes bibliographical references (pages 50-51)This paper investigates the feasibility and effecti...
This paper describes the design-for-testability (DFT) features and test challenges in a general purp...
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended...
In this paper we present a design of a reusable test platform for microprocessors. This platform cou...
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. ...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
Summarization: This paper presents the design and implementation of software for creating test patte...
This paper describes μGP, an evolutionary approach for generating assembly programs tuned for a spe...
In manufacturing testing, functional tests are known to detect unique defects that structural tests ...
Presents an automatic generation system for behavioral test programs of microprocessors. First, the ...
This chapter describes and analyzes a methodology for gathering together test-programs for microproc...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
Includes bibliographical references (page 91)This project presents a Microprocessor System for Autom...
Microprocessor testing is becoming a challenging task, due to the increasing complexity of modern ar...
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach...
Includes bibliographical references (pages 50-51)This paper investigates the feasibility and effecti...
This paper describes the design-for-testability (DFT) features and test challenges in a general purp...
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended...