Model of modification of basic levels of the known radiation defects in silicon and a germanium is offered. Energy of Hubbard is independent of number of electrons on radiation defect, and its size depends on base-line admixtures near-by vacancy defect. If near-by vacancy defect of the interstitial atom of oxygen is located, then energy of the negatively-charged acceptor defect is reducing on 0.06 eV, and energy of donor rises on the same size. The interstitial atom of silicon and of germanium changes the levels of defect on 0.03 eV. The atom of car-bon in the interstitial site changes energy of vacancy defect on 0.035 eV, but in opposite direction. Modification of vacancy defects does not change energy of neutral defect level in the band g...
First results are presented of a study on the impact of O and Ge doping on {113}-defect formation in...
Crystalline silicon (Si) is the key material of the semiconductor industry, with significant applica...
Electrical properties of semiconductor materials are greatly influenced by point defects such as vac...
The main laws of effect of the temperature, density of the particles flux on the formation and disso...
Infrared absorption spectra of the Silicon single-crystals with the Germanium impurity (Ge ≤ 0,7 at....
Abstract. The radiation hardness of Czochralski grown n-type silicon samples doped with germanium (N...
A modelling study of several oxygen related defects in silicon and germanium crystals is reported. T...
The paper is concerned with monocrystals of silicon-germanium solid solutions. The aim of the paper ...
A modelling study of several oxygen related defects in silicon and germanium crystals is reported. T...
A review is given of current knowledge about radiation induced defects in semiconductors and about t...
The principal approximation in the Green's-matrix method for calculating the electronic structure an...
Radiation hardness of Czochralski grown n-type silicon samples, doped by germanium (NGe = 2 ⋅ 1020 c...
Presented in this thesis are the results of computational investigations into radiation defects in s...
one of the possibilities to modify and improve specific parameters of semiconductor devices. Germani...
First results are presented of a study on the impact of O and Ge doping on {113}-defect formation in...
First results are presented of a study on the impact of O and Ge doping on {113}-defect formation in...
Crystalline silicon (Si) is the key material of the semiconductor industry, with significant applica...
Electrical properties of semiconductor materials are greatly influenced by point defects such as vac...
The main laws of effect of the temperature, density of the particles flux on the formation and disso...
Infrared absorption spectra of the Silicon single-crystals with the Germanium impurity (Ge ≤ 0,7 at....
Abstract. The radiation hardness of Czochralski grown n-type silicon samples doped with germanium (N...
A modelling study of several oxygen related defects in silicon and germanium crystals is reported. T...
The paper is concerned with monocrystals of silicon-germanium solid solutions. The aim of the paper ...
A modelling study of several oxygen related defects in silicon and germanium crystals is reported. T...
A review is given of current knowledge about radiation induced defects in semiconductors and about t...
The principal approximation in the Green's-matrix method for calculating the electronic structure an...
Radiation hardness of Czochralski grown n-type silicon samples, doped by germanium (NGe = 2 ⋅ 1020 c...
Presented in this thesis are the results of computational investigations into radiation defects in s...
one of the possibilities to modify and improve specific parameters of semiconductor devices. Germani...
First results are presented of a study on the impact of O and Ge doping on {113}-defect formation in...
First results are presented of a study on the impact of O and Ge doping on {113}-defect formation in...
Crystalline silicon (Si) is the key material of the semiconductor industry, with significant applica...
Electrical properties of semiconductor materials are greatly influenced by point defects such as vac...