We investigated the influence of the relative humidity on amplitude and phase of the cantilever oscillation while operating an atomic force microscope (AFM) in the tapping mode. If the free oscillation amplitude A0 exceeds a certain critical amplitude Ac, the amplitude- and phase-distance curves show a transition from a regime with a net attractive force between tip and sample to a net repulsive regime. For hydrophilic tip and sample this critical amplitude Ac is found to increase with increasing relative humidity. In contrast, no such dependence was found for hydrophobic samples. Numerical simulations show that this behavior can be explained by assuming the intermittent formation and rupture of a capillary neck in each oscillation cycle of...
Tapping mode (TM) atomic force microscopy (AFM) in a liquid environment is widely used to measure th...
Due to the strong capillary condensation, the adhesion force between a Si3N4 atomic force microscope...
Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affect...
We investigated the influence of the relative humidity on amplitude and phase of the cantilever osci...
AbstractThe Atomic Force Microscope (AFM) scans the topography of a sample surface using a micro-siz...
AbstractThe Atomic Force Microscope (AFM) scans the topography of a sample surface using a micro-siz...
Atomic force microscope with applicable types of operation in a liquid environment is widely used to...
Atomic force microscope with applicable types of operation in a liquid environment is widely used to...
Capillary forces are significantly dominant in adhesive forces measured with an atomic force microsc...
Central to tapping mode atomic force microscopy is an oscillating cantilever whose tip in-teracts wi...
Capillary forces are significantly dominant in adhesive forces measured with an atomic force microsc...
In this article tapping-mode atomic force microscope dynamics is studied. The existence of a periodi...
AbstractThe frequency response behavior of Atomic Force Microscopy (AFM) cantilevers in liquids is c...
AbstractThe frequency response behavior of Atomic Force Microscopy (AFM) cantilevers in liquids is c...
Tapping mode (TM) atomic force microscopy (AFM) in a liquid environment is widely used to measure th...
Tapping mode (TM) atomic force microscopy (AFM) in a liquid environment is widely used to measure th...
Due to the strong capillary condensation, the adhesion force between a Si3N4 atomic force microscope...
Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affect...
We investigated the influence of the relative humidity on amplitude and phase of the cantilever osci...
AbstractThe Atomic Force Microscope (AFM) scans the topography of a sample surface using a micro-siz...
AbstractThe Atomic Force Microscope (AFM) scans the topography of a sample surface using a micro-siz...
Atomic force microscope with applicable types of operation in a liquid environment is widely used to...
Atomic force microscope with applicable types of operation in a liquid environment is widely used to...
Capillary forces are significantly dominant in adhesive forces measured with an atomic force microsc...
Central to tapping mode atomic force microscopy is an oscillating cantilever whose tip in-teracts wi...
Capillary forces are significantly dominant in adhesive forces measured with an atomic force microsc...
In this article tapping-mode atomic force microscope dynamics is studied. The existence of a periodi...
AbstractThe frequency response behavior of Atomic Force Microscopy (AFM) cantilevers in liquids is c...
AbstractThe frequency response behavior of Atomic Force Microscopy (AFM) cantilevers in liquids is c...
Tapping mode (TM) atomic force microscopy (AFM) in a liquid environment is widely used to measure th...
Tapping mode (TM) atomic force microscopy (AFM) in a liquid environment is widely used to measure th...
Due to the strong capillary condensation, the adhesion force between a Si3N4 atomic force microscope...
Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affect...