AbstractThe Atomic Force Microscope (AFM) scans the topography of a sample surface using a micro-sized flexible cantilever. In tapping-mode AFM, the tip–surface interactions are strongly nonlinear, rapidly changing and hysteretic. This paper explores, numerically, a flexible beam model that includes attractive, adhesive and repulsive contributions, as well as the interaction of the capillary fluid layers that cover both the tip and the sample in ambient conditions common in experiments. Forward-time simulation has been applied with an event handling numerical technique for dynamic analysis, and the Amplitude–Phase–Distance (APD) curves have been extracted. The branches of periodic solutions are found to end precisely where the cantilever co...