Near surface structure determination using X-ray reflection absorption spectroscopy

Near surface layers structure data as r, N, σ, ΔE0 and known phases and amplitudes as well as thickness were used for the evaluation of X-ray reflection spectra. With these data, the energy dependent index of refraction n = 1 − δ − iβ for each layer can be calculated. The application of the Fresnel theory to an assumed layer structure yields the reflectivity as a function of the energy. As an example, oxidized copper surface is discussed