X-ray-reflectivity fine structure and EXAFS

A simple and fast method is given for the extraction of extended x-ray-absorption fine structure from x-ray-reflectivity spectra. The method is based on the description of the x-ray-reflectivity fine structure as a linear superposition of the fine structures in the real and in the imaginary part of the refractive index. It is applicable at all glancing angles, i.e., above as well as below the critical angle. Besides the smooth part of the refractive index, no other additional information is necessary. As an example, results obtained with calculated nickel data are presented