External Radiation Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single Event Effects (SEE)

Radiation 101: Effects on Hardware and Robotic Systems

Pellish, Jonathan A.

October 2015

We present basic information on different types of radiation effects, including total ionizing dose,...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA GSFC and NEPP

Cochran, Donna J.
Campola, Michael J.
Topper, Alyson D.
Chen, Dakai
Yau, Ka-Yen
Label, Kenneth A.
O'Bryan, Martha V.
Casey, Megan C.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

Advanced CMOS Radiation Effects Testing and Analysis

Pellish, J. A.
Marshall, P. W.
Castaneda, C. M.
Berg, M. D.
Rodbell, K. P.
Phan, A. M.
Seidleck, C. M.
Dodds, N. A.
Kim, H. S.
LaBel, K. A.
Gordon, M. S.
Schwank, J. R.

June 2014

Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology ...

Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

Kim, Hak S.
Phan, Anthony M.
Oldham, Timothy R.
O'Bryan, Martha V.
Musil, Paul L.
Chen, Dakai
Lauenstein, Jean-Marie
Casey, Megan C.
Gigliuto, Robert A.
Marshall, Cheryl
LaBel, Kenneth A.
Overend, Greg A.
Berg, Melanie
Ladbury, Raymond L.
Sanders, Anthony B.
Butte, Alvin J.
Marshall, Paul
Wilcox, Ted
Pellish, Jonathan A.

July 2012

We present the results of single events effects (SEE) testing and analysis investigating the effects...

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Chen, Dakai
Wilcox, Edward Palmer
Lauenstein, Jean-Marie
Label, Kenneth A.
Campola, Michael Joseph
Pellish, Jonathan Allen
Casey, Megan Colleen
Guertin, Steven Michael
Wyrwas, Edward J.
O'Bryan, Martha V.
Berg, Melanie D.

July 2017

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Pellish, Jonathan A.
Wyrwas, Edward J.
Szabo, Carl M.
Chen, Dakai
Campola, Michael J.
Topper, Alyson D.
Wilcox, Edward P.
Casey, Megan C.
LaBel, Kenneth A.
Berg, Melanie D.
Lewellen, John W.
Lauenstein, Jean-Marie
Holloway, Michael A.
O'Bryan, Martha V.

July 2018

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

Berg, Melanie D.
Wilcox, Edward P.
Lauenstein, Jean Marie
Chen, Dakai
LaBel, Kenneth A.
Casey, Megan C.
Ikpe, Stanley A.
O'Bryan, Martha V.
Pellish, Jonathan A.
Szabo, Carl M.
Campola, Michael J,

July 2016

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

Berg, Melanie D.
Campola, Michael J.
LaBel, Kenneth A.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Pellish, Jonathan A.
Casey, Megan C.
Chen, Dakai
O'Bryan, Martha V.

July 2015

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Domestic Proton Facilities for Radiation Testing of Electronics: Snapshot Report

Turflinger, Thomas
Pellish, Jonathan A.
Label, Kenneth A.

January 2020

This is an update to the ongoing series of presentations tracking the state of domestic proton facil...

Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Buchner, Stephen P.
Violette, Daniel P.
Pellish, Jonathan A.
Chen, Dakai
Berg, Melanie D.
Gigliuto, Robert A.
Casey, Megan C.
Lauenstein, Jean-Marie
O'Bryan, Martha V.
Ladbury, Raymond L.
Boutte, Alvin J.
Topper, Alyson D.
Cochran, Donna J.
Campola, Michael J.
LaBel, Kenneth A.
Wilcox, Edward P.

July 2014

We present results and analysis investigating the effects of radiation on a variety of candidate spa...

Radiation Test Results on COTS and non-COTS Electronic Devices for NASA-JSC Space Flight Projects

Bailey, C. R.
O'Neill, P. M.
Allums, Kimberly K.
Reddell, B. D.
Nguyen, K. V.

July 2012

This presentation reports the results of recent proton and heavy ion Single Event Effect (SEE) testi...

Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

Boutte, Alvin J.
Gigliuto, Robert A.
LaBel, Kenneth A.
Violette, Daniel
Casey, Megan C.
Ladbury, Raymond L.
Pellish, Jonathan A.
Chen, Dakai
Xapsos, Michael A.
Campola, Michael J.
Wilcox, Edward P.
Lauenstein, Jean-Marie
O'Bryan, Martha V.
Cochran, Donna J.

July 2015

Total ionizing dose and displacement damage testing is performed to characterize and determine the f...

Protons, Aerospace, and Electronics: A National Interest

Turflinger, Thomas L.
LaBel, Kenneth A.

March 2018

The aerospace and semiconductor industries lost approx. 2000 hours annually of research access when ...

Team Update on North American Proton Facilities for Radiation Testing

LaBel, Kenneth A.
Moss, Steven
Kostic, Andrew
Foster, Charles
Turflinger, Thomas
Davis, Scott
Haas, Thurman
Wert, Jerry
Guertin, Steven
George, Jeffrey
Reed, Robert
Wie, Brian

February 2016

In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation pr...

Radiation 101: Effects on Hardware and Robotic Systems

Pellish, Jonathan A.

October 2015

We present basic information on different types of radiation effects, including total ionizing dose,...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA GSFC and NEPP

Cochran, Donna J.
Campola, Michael J.
Topper, Alyson D.
Chen, Dakai
Yau, Ka-Yen
Label, Kenneth A.
O'Bryan, Martha V.
Casey, Megan C.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

Advanced CMOS Radiation Effects Testing and Analysis

Pellish, J. A.
Marshall, P. W.
Castaneda, C. M.
Berg, M. D.
Rodbell, K. P.
Phan, A. M.
Seidleck, C. M.
Dodds, N. A.
Kim, H. S.
LaBel, K. A.
Gordon, M. S.
Schwank, J. R.

June 2014

Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology ...

Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

Kim, Hak S.
Phan, Anthony M.
Oldham, Timothy R.
O'Bryan, Martha V.
Musil, Paul L.
Chen, Dakai
Lauenstein, Jean-Marie
Casey, Megan C.
Gigliuto, Robert A.
Marshall, Cheryl
LaBel, Kenneth A.
Overend, Greg A.
Berg, Melanie
Ladbury, Raymond L.
Sanders, Anthony B.
Butte, Alvin J.
Marshall, Paul
Wilcox, Ted
Pellish, Jonathan A.

July 2012

We present the results of single events effects (SEE) testing and analysis investigating the effects...

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Chen, Dakai
Wilcox, Edward Palmer
Lauenstein, Jean-Marie
Label, Kenneth A.
Campola, Michael Joseph
Pellish, Jonathan Allen
Casey, Megan Colleen
Guertin, Steven Michael
Wyrwas, Edward J.
O'Bryan, Martha V.
Berg, Melanie D.

July 2017

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Pellish, Jonathan A.
Wyrwas, Edward J.
Szabo, Carl M.
Chen, Dakai
Campola, Michael J.
Topper, Alyson D.
Wilcox, Edward P.
Casey, Megan C.
LaBel, Kenneth A.
Berg, Melanie D.
Lewellen, John W.
Lauenstein, Jean-Marie
Holloway, Michael A.
O'Bryan, Martha V.

July 2018

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

Berg, Melanie D.
Wilcox, Edward P.
Lauenstein, Jean Marie
Chen, Dakai
LaBel, Kenneth A.
Casey, Megan C.
Ikpe, Stanley A.
O'Bryan, Martha V.
Pellish, Jonathan A.
Szabo, Carl M.
Campola, Michael J,

July 2016

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

Berg, Melanie D.
Campola, Michael J.
LaBel, Kenneth A.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Pellish, Jonathan A.
Casey, Megan C.
Chen, Dakai
O'Bryan, Martha V.

July 2015

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Domestic Proton Facilities for Radiation Testing of Electronics: Snapshot Report

Turflinger, Thomas
Pellish, Jonathan A.
Label, Kenneth A.

January 2020

This is an update to the ongoing series of presentations tracking the state of domestic proton facil...

Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Buchner, Stephen P.
Violette, Daniel P.
Pellish, Jonathan A.
Chen, Dakai
Berg, Melanie D.
Gigliuto, Robert A.
Casey, Megan C.
Lauenstein, Jean-Marie
O'Bryan, Martha V.
Ladbury, Raymond L.
Boutte, Alvin J.
Topper, Alyson D.
Cochran, Donna J.
Campola, Michael J.
LaBel, Kenneth A.
Wilcox, Edward P.

July 2014

We present results and analysis investigating the effects of radiation on a variety of candidate spa...

Radiation Test Results on COTS and non-COTS Electronic Devices for NASA-JSC Space Flight Projects

Bailey, C. R.
O'Neill, P. M.
Allums, Kimberly K.
Reddell, B. D.
Nguyen, K. V.

July 2012

This presentation reports the results of recent proton and heavy ion Single Event Effect (SEE) testi...

Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

Boutte, Alvin J.
Gigliuto, Robert A.
LaBel, Kenneth A.
Violette, Daniel
Casey, Megan C.
Ladbury, Raymond L.
Pellish, Jonathan A.
Chen, Dakai
Xapsos, Michael A.
Campola, Michael J.
Wilcox, Edward P.
Lauenstein, Jean-Marie
O'Bryan, Martha V.
Cochran, Donna J.

July 2015

Total ionizing dose and displacement damage testing is performed to characterize and determine the f...

Protons, Aerospace, and Electronics: A National Interest

Turflinger, Thomas L.
LaBel, Kenneth A.

March 2018

The aerospace and semiconductor industries lost approx. 2000 hours annually of research access when ...

Team Update on North American Proton Facilities for Radiation Testing

LaBel, Kenneth A.
Moss, Steven
Kostic, Andrew
Foster, Charles
Turflinger, Thomas
Davis, Scott
Haas, Thurman
Wert, Jerry
Guertin, Steven
George, Jeffrey
Reed, Robert
Wie, Brian

February 2016

In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation pr...

Radiation 101: Effects on Hardware and Robotic Systems

Pellish, Jonathan A.

October 2015

We present basic information on different types of radiation effects, including total ionizing dose,...

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA GSFC and NEPP

Cochran, Donna J.
Campola, Michael J.
Topper, Alyson D.
Chen, Dakai
Yau, Ka-Yen
Label, Kenneth A.
O'Bryan, Martha V.
Casey, Megan C.

July 2017

Total ionizing dose and displacement damage testing was performed to characterize and determine the ...

Advanced CMOS Radiation Effects Testing and Analysis

Pellish, J. A.
Marshall, P. W.
Castaneda, C. M.
Berg, M. D.
Rodbell, K. P.
Phan, A. M.
Seidleck, C. M.
Dodds, N. A.
Kim, H. S.
LaBel, K. A.
Gordon, M. S.
Schwank, J. R.

June 2014

Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology ...

External Radiation Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single Event Effects (SEE)

Abstract

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External Radiation Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single Event Effects (SEE)

Abstract

Extracted data

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