Add to ORKGThis is an update to the ongoing series of presentations tracking the state of domestic proton facility access for the purpose of single event effects (SEE) testing of microelectronics devices and systems. This includes proton research facilities and oncology therapy centers
A literature review of the near-Earth trapped radiation of the Van Allen Belts, the radiation within...
Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...
Although proton SEE testing can place constraints on some heavy-ion SEE susceptibilities, it is impo...
In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation pr...
The aerospace and semiconductor industries lost approx. 2000 hours annually of research access when ...
This presentation is an outbrief of the current team status for access to domestic high (200 MeV) en...
In this presentation we will provide basic radiation effects on electronics, information on radiatio...
This presentation reports the results of recent proton and heavy ion Single Event Effect (SEE) testi...
We report low-energy proton and alpha particle SEE data on a 32 nm silicon-on-insulator (SOI) comple...
This research was sponsored by the National Science Foundation Grant NSF PHY-931478
This paper presents the latest test results of power regulator devices under proton irradiation. Sin...
Single-Event Effects (SEE) testing was conducted on the nVidia Jetson TX1 System on Chip (SOC); here...
The intent of this document is to provide guidance on when and what type of -SEE tests should be per...
We present results and analysis investigating the effects of radiation on a variety of candidate spa...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
A literature review of the near-Earth trapped radiation of the Van Allen Belts, the radiation within...
Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...
Although proton SEE testing can place constraints on some heavy-ion SEE susceptibilities, it is impo...
In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation pr...
The aerospace and semiconductor industries lost approx. 2000 hours annually of research access when ...
This presentation is an outbrief of the current team status for access to domestic high (200 MeV) en...
In this presentation we will provide basic radiation effects on electronics, information on radiatio...
This presentation reports the results of recent proton and heavy ion Single Event Effect (SEE) testi...
We report low-energy proton and alpha particle SEE data on a 32 nm silicon-on-insulator (SOI) comple...
This research was sponsored by the National Science Foundation Grant NSF PHY-931478
This paper presents the latest test results of power regulator devices under proton irradiation. Sin...
Single-Event Effects (SEE) testing was conducted on the nVidia Jetson TX1 System on Chip (SOC); here...
The intent of this document is to provide guidance on when and what type of -SEE tests should be per...
We present results and analysis investigating the effects of radiation on a variety of candidate spa...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
A literature review of the near-Earth trapped radiation of the Van Allen Belts, the radiation within...
Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...
Although proton SEE testing can place constraints on some heavy-ion SEE susceptibilities, it is impo...