Reliability of transistors is on the decline as transistors continue to shrink in size. Aggressive voltage scaling is making the problem even worse. Scaled-down transistors are more susceptible to transient faults as well as permanent in-field hardware failures. In order to continue to reap the benefits of technology scaling, it has become imperative to tackle the challenges risen due to the decreasing reliability of devices for the mainstream commodity market. Along with the worsening reliability, achieving energy efficiency and performance improvement by scaling is increasingly providing diminishing marginal returns. More than any other time in history, the semiconductor industry faces the crossroad of unreliability and the need to impr...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of...
abstract: Soft errors are considered as a key reliability challenge for sub-nano scale transistors. ...
Technology scaling has led to growing concerns about reliability in microprocessors. Currently, faul...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...
In this dissertation, novel methodologies for designing energy-efficient hardware systems that deliv...
As semiconductor technology scales into the deep submicron regime the occurrence of transient or sof...
As high computing power is available at an affordable cost, we rely on microprocessor-based systems ...
Modern computer chips comprise many components, including microprocessor cores, memory modules, on-c...
Modern computer chips comprise many components, including microprocessor cores, memory modules, on-c...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
In the last decades, the computing technology experienced tremendous developments. For instance, tra...
Efficient low-power operation is critically important for the success of the next-generation signal ...
In this dissertation, novel methodologies for designing energy-efficient hardware systems that deliv...
System-on-chip design is becoming increasingly complex as technology scaling enables more and more f...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of...
abstract: Soft errors are considered as a key reliability challenge for sub-nano scale transistors. ...
Technology scaling has led to growing concerns about reliability in microprocessors. Currently, faul...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...
In this dissertation, novel methodologies for designing energy-efficient hardware systems that deliv...
As semiconductor technology scales into the deep submicron regime the occurrence of transient or sof...
As high computing power is available at an affordable cost, we rely on microprocessor-based systems ...
Modern computer chips comprise many components, including microprocessor cores, memory modules, on-c...
Modern computer chips comprise many components, including microprocessor cores, memory modules, on-c...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
In the last decades, the computing technology experienced tremendous developments. For instance, tra...
Efficient low-power operation is critically important for the success of the next-generation signal ...
In this dissertation, novel methodologies for designing energy-efficient hardware systems that deliv...
System-on-chip design is becoming increasingly complex as technology scaling enables more and more f...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of...
abstract: Soft errors are considered as a key reliability challenge for sub-nano scale transistors. ...
Technology scaling has led to growing concerns about reliability in microprocessors. Currently, faul...