Efficient low-power operation is critically important for the success of the next-generation signal processing applications. Device and supply voltage have been continuously scaled to meet a more constrained power envelope, but scaling has created resiliency challenges, including increasing timing faults and soft errors. Our research aims at designing low-power and robust circuits and systems for signal processing by drawing circuit, architecture, and algorithm approaches. To gain an insight into the system faults due to supply voltage reduction, we researched the two primary effects that determine the minimum supply voltage (VMIN) in Intel’s tri-gate CMOS technology, namely process variations and gate-dielectric soft breakdown. We determi...
Over two decades of research has led to numerous low-power design techniques being reported. Two pop...
Device scaling has resulted in large scale integrated, high performance, low-power, and low cost sys...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of...
In this paper, we investigate the impact of circuit misbehavior due to parametric variations and vol...
As CMOS technology has developed considerably in the last few decades, many SoCs have been implement...
The revolution in chip manufacturing processes spanning five decades has proliferated high performan...
Low-power Digital Signal Processing (DSP) circuits are critical to commercial System-on-Chip design ...
With the development of VLSI technologies, the sensor systems of all kinds of applications have ente...
Reliability of transistors is on the decline as transistors continue to shrink in size. Aggressive v...
Device scaling has resulted in large scale integrated, high performance, low-power, and low cost sys...
While technology scaling has enabled the design of complex information systems, uncertainty in the V...
While technology scaling has enabled the design of complex information systems, uncertainty in the V...
CMOS technology scaling is bringing new challenges to the designers in the form of new failure modes...
As an increase of intelligent and self-powered devices is forecasted for our future everyday life, t...
Over two decades of research has led to numerous low-power design techniques being reported. Two pop...
Device scaling has resulted in large scale integrated, high performance, low-power, and low cost sys...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of...
In this paper, we investigate the impact of circuit misbehavior due to parametric variations and vol...
As CMOS technology has developed considerably in the last few decades, many SoCs have been implement...
The revolution in chip manufacturing processes spanning five decades has proliferated high performan...
Low-power Digital Signal Processing (DSP) circuits are critical to commercial System-on-Chip design ...
With the development of VLSI technologies, the sensor systems of all kinds of applications have ente...
Reliability of transistors is on the decline as transistors continue to shrink in size. Aggressive v...
Device scaling has resulted in large scale integrated, high performance, low-power, and low cost sys...
While technology scaling has enabled the design of complex information systems, uncertainty in the V...
While technology scaling has enabled the design of complex information systems, uncertainty in the V...
CMOS technology scaling is bringing new challenges to the designers in the form of new failure modes...
As an increase of intelligent and self-powered devices is forecasted for our future everyday life, t...
Over two decades of research has led to numerous low-power design techniques being reported. Two pop...
Device scaling has resulted in large scale integrated, high performance, low-power, and low cost sys...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...