Add to ORKGEffect of surface structures upon ultrathin film interference fringes generated from extremely thin films or epitaxial layers grown on semiconductor wafers has been studied. Since dark regions of fringes correspond to the places where the thin films are destroyed or absent, the fringes are investigated to detect uneven surfaces with undesired structures. Therefore, surface microstructures can be detected and characterized effectively by the modification of the fringes
By passing a periodically interrupted current through a germanium sample, modulation of the spectral...
Anomalous dispersion effects distort the EXAFS interference functions obtained at glancing angles of...
A measurement of surface Brillouin scattering from a 2250-\uc5 film of silica grown on (001) silicon...
In this paper, it is shown that the analysis of the interference fringes due to light reflected from...
The theory of "classical" optical interference coatings is based on assumptions like ideal homogenei...
This paper presents a review of the subwavelength interference effects of light in structured surfac...
We report the observation of oscillating features in differential reflectance spectra from the GaAs ...
The non-destructive study and characterisation of thin films and their interfaces, on an atomic scal...
Three studies of thin metal films grown on semiconductor and insulator substrates are presented. Thi...
The surface of a film grown epitaxially on a crystalline substrate is generally rough, even if the ...
Thin metal films show a residual transmission for light in the visible and UV spectral range. This t...
Unusual structural colors are demonstrated in thin-film coatings due to a combination of optical int...
Reflection from thin films on a substrate result in oscillations called Kiessig fringes. Calculation...
The non-destructive study and characterisation of thin films and their interfaces, on an atomic scal...
Large area high temperature superconducting thin films are needed for the implementation of a range ...
By passing a periodically interrupted current through a germanium sample, modulation of the spectral...
Anomalous dispersion effects distort the EXAFS interference functions obtained at glancing angles of...
A measurement of surface Brillouin scattering from a 2250-\uc5 film of silica grown on (001) silicon...
In this paper, it is shown that the analysis of the interference fringes due to light reflected from...
The theory of "classical" optical interference coatings is based on assumptions like ideal homogenei...
This paper presents a review of the subwavelength interference effects of light in structured surfac...
We report the observation of oscillating features in differential reflectance spectra from the GaAs ...
The non-destructive study and characterisation of thin films and their interfaces, on an atomic scal...
Three studies of thin metal films grown on semiconductor and insulator substrates are presented. Thi...
The surface of a film grown epitaxially on a crystalline substrate is generally rough, even if the ...
Thin metal films show a residual transmission for light in the visible and UV spectral range. This t...
Unusual structural colors are demonstrated in thin-film coatings due to a combination of optical int...
Reflection from thin films on a substrate result in oscillations called Kiessig fringes. Calculation...
The non-destructive study and characterisation of thin films and their interfaces, on an atomic scal...
Large area high temperature superconducting thin films are needed for the implementation of a range ...
By passing a periodically interrupted current through a germanium sample, modulation of the spectral...
Anomalous dispersion effects distort the EXAFS interference functions obtained at glancing angles of...
A measurement of surface Brillouin scattering from a 2250-\uc5 film of silica grown on (001) silicon...