Three studies of thin metal films grown on semiconductor and insulator substrates are presented. Thin films grown on a substrate decorated by a periodic array of atomic wires can exhibit unusual properties such as stacking faults and electronic topological phase transitions due to the interfacial modulation. We report a study of Ag films grown on an array of atomic In chains on . Prior STM studies have suggested an array of stacking faults in the Ag films that allow the film lattice structure to match the interfacial modulations. STM however can only probe the surface. Our work uses x-ray diffraction to elucidate the internal 3-dimensional structure of this system. The measurements are found to be best explained by a model in which the uni...
This thesis investigates the interplay between reduced dimensionality, electronic structure, and int...
International audienceWe have studied the growth and electronic structure of Ag thin films on the fi...
textMany properties of the thin films are different from the bulk value and in many cases, depend dr...
Three studies of thin metal films grown on semiconductor and insulator substrates are presented. Thi...
The electronic properties of thin metallic films deviate from the corresponding bulk ones when the f...
We have investigated by scanning tunneling microscopy the growth of Bi and Ag thin films on the five...
Real time in situ synchrotron x-ray studies of continuous Pb deposition on Si(111)-(7 × 7) at 180 K...
Confinement of electrons can occur in metal islands or in continuous films grown heteroepitaxially u...
This thesis investigates the interplay between reduced dimensionality, electronic structure, and int...
As the size of a metallic system approaches the atomic scale, deviations from the bulk are expected ...
Thin metal films have been studied for decades and are widely employed in a myriad of applications. ...
The physical properties of materials tend to strongly depend on the material’s dimensions. They usua...
The substrate lattice structure may have a considerable influence on the formation of quantum well s...
When the thickness of a film approaches the nanoscale, the confinement of electrons in the film by i...
Epitaxial films that are only several atoms layers thick exhibit interesting properties associated w...
This thesis investigates the interplay between reduced dimensionality, electronic structure, and int...
International audienceWe have studied the growth and electronic structure of Ag thin films on the fi...
textMany properties of the thin films are different from the bulk value and in many cases, depend dr...
Three studies of thin metal films grown on semiconductor and insulator substrates are presented. Thi...
The electronic properties of thin metallic films deviate from the corresponding bulk ones when the f...
We have investigated by scanning tunneling microscopy the growth of Bi and Ag thin films on the five...
Real time in situ synchrotron x-ray studies of continuous Pb deposition on Si(111)-(7 × 7) at 180 K...
Confinement of electrons can occur in metal islands or in continuous films grown heteroepitaxially u...
This thesis investigates the interplay between reduced dimensionality, electronic structure, and int...
As the size of a metallic system approaches the atomic scale, deviations from the bulk are expected ...
Thin metal films have been studied for decades and are widely employed in a myriad of applications. ...
The physical properties of materials tend to strongly depend on the material’s dimensions. They usua...
The substrate lattice structure may have a considerable influence on the formation of quantum well s...
When the thickness of a film approaches the nanoscale, the confinement of electrons in the film by i...
Epitaxial films that are only several atoms layers thick exhibit interesting properties associated w...
This thesis investigates the interplay between reduced dimensionality, electronic structure, and int...
International audienceWe have studied the growth and electronic structure of Ag thin films on the fi...
textMany properties of the thin films are different from the bulk value and in many cases, depend dr...