Some observations were made to study formation mechanism of small grooves directed on [011] on a surface of GaAs epitaxial layer, which was grown on (100) surface of Cr-doped GaAs from the vapour phase. It was tried to observe some lattice defects which may cause formation of these grooves, by etching technique, X-ray topography and transmission electron microscope. However, any lattice defects which correspond to the grooves were not found by these three methods. Therefore it was concluded that the grooves were not formed owing to lattice defects which disturbed lateral growth of the crystal. It is assumed that the grooves could be formed by gaseous etching which may take place at the end of crystal growth process
The main structural microdefects in GaAs are point defects (native defects, dopants), dislocations, ...
When (100) wafers of undoped semi-insulating LEC GaAs are etched in the AB etch, both grooved etch f...
The thinning of semiconductor specimens for trans-mission electron microscopy by the wel l-known jet...
Some observations were made to study formation mechanism of small grooves directed on [011] on a sur...
The defect patterns in GaAs crystal grown using liquid encapsulated Czochralski and gradient freeze ...
4 pagesWe present the characterization of crystal defects in GaAs layers grown on silicon substrates...
Recently a new eutectic (KOH + NaOH) (I) has been developed to reveal defects in gallium arsenide (G...
Research focused on control of misfit dislocations in strained epitaxial layers of GaAs through prep...
The formation of misfit dislocation was studied in GaAs homoepitaxiallayers on the substrates contai...
A formation mechanism of two-dimensional defects which are produced in a Si-doped GaAs crystal durin...
The formation of misfit dislocation was studied in GaAs homoepitaxiallayers on the substrates contai...
Growth nuclei and surface defects are studied with scanning tunneling microscopy on the GaAs((1) ove...
Rode pointed out that periodically-disturbed surface morphology can occur on epilayers grown on slig...
Growth nuclei and surface defects are studied with scanning tunneling microscopy on the GaAs((1) ove...
Growth nuclei and surface defects are studied with scanning tunneling microscopy on the GaAs((1) ove...
The main structural microdefects in GaAs are point defects (native defects, dopants), dislocations, ...
When (100) wafers of undoped semi-insulating LEC GaAs are etched in the AB etch, both grooved etch f...
The thinning of semiconductor specimens for trans-mission electron microscopy by the wel l-known jet...
Some observations were made to study formation mechanism of small grooves directed on [011] on a sur...
The defect patterns in GaAs crystal grown using liquid encapsulated Czochralski and gradient freeze ...
4 pagesWe present the characterization of crystal defects in GaAs layers grown on silicon substrates...
Recently a new eutectic (KOH + NaOH) (I) has been developed to reveal defects in gallium arsenide (G...
Research focused on control of misfit dislocations in strained epitaxial layers of GaAs through prep...
The formation of misfit dislocation was studied in GaAs homoepitaxiallayers on the substrates contai...
A formation mechanism of two-dimensional defects which are produced in a Si-doped GaAs crystal durin...
The formation of misfit dislocation was studied in GaAs homoepitaxiallayers on the substrates contai...
Growth nuclei and surface defects are studied with scanning tunneling microscopy on the GaAs((1) ove...
Rode pointed out that periodically-disturbed surface morphology can occur on epilayers grown on slig...
Growth nuclei and surface defects are studied with scanning tunneling microscopy on the GaAs((1) ove...
Growth nuclei and surface defects are studied with scanning tunneling microscopy on the GaAs((1) ove...
The main structural microdefects in GaAs are point defects (native defects, dopants), dislocations, ...
When (100) wafers of undoped semi-insulating LEC GaAs are etched in the AB etch, both grooved etch f...
The thinning of semiconductor specimens for trans-mission electron microscopy by the wel l-known jet...