We present a wide-field imaging technique recently developed by us to measure quantitatively the optical extinction cross section σext of individual nanoparticles. The technique is simple, high speed, and enables the simultaneous acquisition of hundreds of nanoparticles in the wide-field image for statistical analysis, with a sensitivity corresponding to the detection of a single gold nanoparticle down to 2nm diameter. Notably, the method is applicable to any nanoparticle (dielectric, semiconducting, metallic), and can be easily and cost-effectively implemented on a conventional wide-field microscope. Of specific significance for accurate quantification, we show that σext depends on the numerical aperture of the microscope illumination due ...