With the growing complexity of modern VLSI designs, design errors become increasingly common. Design debugging today emerges as a bottleneck in the design flow, consuming up to 30% of the overall design effort. Unfortunately, design debugging is still a predominantly manual process in the industry. To tackle this problem, we enhance existing automated debugging tools and extend their applications to different design domains. The first contribution improves the performance of automated design debugging tools by using structural circuit properties, namely dominance relationships and non-solution implications. Overall, a 42% average reduction in solving run-time demonstrates the efficacy of this approach. The second contribution pres...
Abstract—Debugging is one of the major bottlenecks in the current VLSI design process as design size...
As VLSI designs grow in complexity and size, errors become more frequent and difficult to track. Rec...
This book describes automated debugging approaches for the bugs and the faults which appear in diffe...
The size and complexity of modern VLSI computer chips are growing at a rapid pace. Functional debugg...
The size and complexity of modern VLSI computer chips are growing at a rapid pace. Functional debugg...
The relentless growth in size and complexity of semiconductor devices over the last decades continue...
The relentless growth in size and complexity of semiconductor devices over the last decades continue...
Abstract — As contemporary very large scale integration de-signs grow in complexity, design debuggin...
With the growing size of modern integrated circuit designs, automated design tools have taken an imp...
With the growing size of modern integrated circuit designs, automated design tools have taken an imp...
Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computer...
Improving the performance and functionality of contemporary debugging tools is essential to alleviat...
Improving the performance and functionality of contemporary debugging tools is essential to alleviat...
Over the past three decades, the growing list of requirements for integrated circuits has continuall...
Over the past three decades, the growing list of requirements for integrated circuits has continuall...
Abstract—Debugging is one of the major bottlenecks in the current VLSI design process as design size...
As VLSI designs grow in complexity and size, errors become more frequent and difficult to track. Rec...
This book describes automated debugging approaches for the bugs and the faults which appear in diffe...
The size and complexity of modern VLSI computer chips are growing at a rapid pace. Functional debugg...
The size and complexity of modern VLSI computer chips are growing at a rapid pace. Functional debugg...
The relentless growth in size and complexity of semiconductor devices over the last decades continue...
The relentless growth in size and complexity of semiconductor devices over the last decades continue...
Abstract — As contemporary very large scale integration de-signs grow in complexity, design debuggin...
With the growing size of modern integrated circuit designs, automated design tools have taken an imp...
With the growing size of modern integrated circuit designs, automated design tools have taken an imp...
Electronic devices make up a vital part of our lives. These are seen from mobiles, laptops, computer...
Improving the performance and functionality of contemporary debugging tools is essential to alleviat...
Improving the performance and functionality of contemporary debugging tools is essential to alleviat...
Over the past three decades, the growing list of requirements for integrated circuits has continuall...
Over the past three decades, the growing list of requirements for integrated circuits has continuall...
Abstract—Debugging is one of the major bottlenecks in the current VLSI design process as design size...
As VLSI designs grow in complexity and size, errors become more frequent and difficult to track. Rec...
This book describes automated debugging approaches for the bugs and the faults which appear in diffe...