IODP Expedition 354 X-ray diffraction (XRD)
- France-Lanord, Christian
- Spiess, Volkhard
- Klaus, Adam
- Schwenk, Tillmann
- Adhikari, Rishi R.
- Adhikari, Swostik K.
- Bahk, Jang J.
- Baxter, Alan T.
- Cruz, Jarrett W.
- Das, Supriyo K.
- Dekens, Petra
- Duleba, Wania
- Fox, Lyndsey
- Galy, Albert
- Galy, Valier
- Ge, Junyi
- Gleason, James D.
- Gyawali, Babu
- Huyghe, Pascale
- Jia, Guodong
- Lantzsch, Hendrik
- Manoj, M. C.
- Martos, Yasmina M.
- Meynadier, Laure
- Najman, Yani M.R.
- Nakajima, Arata
- Ponton, Camilo
- Reilly, Brendan T.
- Rogers, Kimberly G.
- Savian, Jairo F.
- Selkin, Peter A.
- Weber, Michael E.
- Williams, Trevor
- Yoshida, Kohki
Publication date
September 2016
DOIAbstract
X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG)
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