IODP Expedition 396 X-ray diffraction (XRD)
- Planke, Sverre
- Berndt, Christian
- Alvarez Zarikian, Carlos A.
- Agarwal, Amar
- Andrews, Graham D.M.
- Betlem, Peter
- Bhattacharya, Joyeeta
- Brinkhuis, Henk
- Chatterjee, Sayantani
- Christopoulou, Marialena
- Clementi, Vincent J.
- Ferré, Eric C.
- Filina, Irina Y.
- Frieling, Joost
- Guo, Pengyuan
- Harper, Dustin T.
- Jones, Morgan T.
- Lambart, Sarah
- Longman, Jack
- Millett, John
- Mohn, Geoffroy
- Nakaoka, Reina
- Scherer, Reed P.
- Tegner, Christian
- Varela, Natalia
- Wang, Mengyuan
- Xu, Weimu
- Yager, Stacy L.
Publication date
April 2023
DOIAbstract
X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG)
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