Add to ORKGA simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is described. The method uses derivative-free optimization in order to find a global optimum of an image variance, which is an image quality measure. The Nelder-Mead simplex method and the Powell interpolation-based trust-region method are discussed and compared for an application running on a scanning transmission electron microscope
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
Nowadays electron microscopy still requires an expert operator in order to manually obtain in-focus ...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
Automatic focusing methods are based on an image quality measure, which is a realvalued estimation o...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
Automatic focusing methods are based on an image quality measure, which is a realvalued estimation o...
Nowadays electron microscopy still requires an expert operator in order to manually obtain in-focus ...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
Nowadays electron microscopy still requires an expert operator in order to manually obtain in-focus ...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
Automatic focusing methods are based on an image quality measure, which is a realvalued estimation o...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
Automatic focusing methods are based on an image quality measure, which is a realvalued estimation o...
Nowadays electron microscopy still requires an expert operator in order to manually obtain in-focus ...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...