Add to ORKGA simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is described. The method uses derivative-free optimization in order to find a global optimum of an image variance, which is an image quality measure. The Nelder-Mead simplex method and the Powell interpolation-based trust-region method are discussed and compared for an application running on a scanning transmission electron microscope
Automatic focusing methods are based on an image quality measure, which is a realvalued estimation o...
This thesis describes the physical nature of corrections of an electron microscope and mathematical ...
Defocus and astigmatism can lead to blurred images and poor resolution. This paper presents a simpli...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
Nowadays electron microscopy still requires an expert operator in order to manually obtain in-focus ...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
Nowadays electron microscopy still requires an expert operator in order to manually obtain in-focus ...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Automatic focusing methods are based on an image quality measure, which is a realvalued estimation o...
Automatic focusing methods are based on an image quality measure, which is a realvalued estimation o...
This thesis describes the physical nature of corrections of an electron microscope and mathematical ...
Defocus and astigmatism can lead to blurred images and poor resolution. This paper presents a simpli...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
A simultaneous autofocus and two-fold astigmatism correction method for electron microscopy is descr...
Nowadays electron microscopy still requires an expert operator in order to manually obtain in-focus ...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
A new simultaneous autofocus and two-fold astigmatism correction method is proposed for High Angle A...
Nowadays electron microscopy still requires an expert operator in order to manually obtain in-focus ...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Most automatic focusing methods are based on a sharpness function, which delivers a real-valued esti...
Automatic focusing methods are based on an image quality measure, which is a realvalued estimation o...
Automatic focusing methods are based on an image quality measure, which is a realvalued estimation o...
This thesis describes the physical nature of corrections of an electron microscope and mathematical ...
Defocus and astigmatism can lead to blurred images and poor resolution. This paper presents a simpli...