An atomic force microscope which is operated in the oscillating mode is an example of an impact oscillator. The description of such dynamical systems can be reduced to a mathematical mapping, which displays a square-root singularity. A direct consequence of this property is the emergence of an infinite series of period-adding bifurcations. This extremely characteristic phenomenon should be observed in atomic force microscopes. We consider an atomic force microscope in which the tip-substrate forces are modelled by a liquid-bridge interaction. By integrating the dynamical equations we show that the atomic force microscopy (AFM) dynamical behaviour has the same characteristic bifurcation scenario as the square-root map. We point to the remark...
The dynamic behaviors of an Atomic Force Microscope are of interest, and variously unpredictable phe...
This paper considers discontinuity-induced bifurcations due to the onset and termination of hysteret...
Central to tapping mode atomic force microscopy is an oscillating cantilever whose tip in-teracts wi...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
When the atomic force microscopy (AFM) in tapping mode is in intermittent contact with a soft substr...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
The dynamic behaviors of an Atomic Force Microscope are of interest, and variously unpredictable phe...
This paper considers discontinuity-induced bifurcations due to the onset and termination of hysteret...
Central to tapping mode atomic force microscopy is an oscillating cantilever whose tip in-teracts wi...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
When the atomic force microscopy (AFM) in tapping mode is in intermittent contact with a soft substr...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
The dynamic behaviors of an Atomic Force Microscope are of interest, and variously unpredictable phe...
This paper considers discontinuity-induced bifurcations due to the onset and termination of hysteret...
Central to tapping mode atomic force microscopy is an oscillating cantilever whose tip in-teracts wi...