Conventional hysteresis modeling of piezoelectric actuators using interferometers or capacitive sensors is often performed off-line. However, the hysteresis of the piezoelectric actuator changes as the load acting on it or the driving frequency of the input signal alters, demanding that the hysteresis of the micromanipulator be modeled on the fly. The employment of interferometers or capacitive sensors is a challenging task in micromanipulation systems due to their special requirements, e.g., the micropipette tip is desired to provide mirror-like reflection of the incoming beam if an interferometer is employed while a capacitive sensor might not be easily placed in the workspace. An automatic Prandtl-Ishlinskii hysteresis modeling method is...
Piezoelectric actuator (PEA) is an ideal microscale and nanoscale actuator because of its ultra-prec...
In this paper an open-loop actuation strategy based on a Prandtl-Ishlinskii hysteresis model is appl...
The manipulation of samples in atomic force microscopes (AFMs) is often performed using piezoelectri...
Piezoelectric actuators are widely used in micromanipulation and miniature robots due to their rapid...
nonlinear lumped-parameter model of a piezoelectric stack A, ctuator has been developed to describe ...
Piezoceramics are potential sensors and actuators for a wide range of applications in smart structur...
Micro-manipulation is extremely challenging as it requires high repeatability of the system, as well...
To successfully exploit the full potential of piezoelectric actuators in micro/nano positioning syst...
This paper presents Bouc-Wen hysteresis modelling and tracking control of piezoelectric stack APA120...
This paper presents the development and initial results of a controller based on a novel rate-depend...
Piezoelectric actuators are widely used in the field of micro- and nanopositioning due to their high...
Atomic force microscopes offer the possibility for imaging a sample topography with accuracy in the ...
This paper presents the research work on a 1 degree of freedom (DOF) force reflecting tele-micromani...
International audienceThis paper presents the characterization, modeling and precise control of a 2-...
International audienceThis article investigates precise positioning at the micrometer scale using pi...
Piezoelectric actuator (PEA) is an ideal microscale and nanoscale actuator because of its ultra-prec...
In this paper an open-loop actuation strategy based on a Prandtl-Ishlinskii hysteresis model is appl...
The manipulation of samples in atomic force microscopes (AFMs) is often performed using piezoelectri...
Piezoelectric actuators are widely used in micromanipulation and miniature robots due to their rapid...
nonlinear lumped-parameter model of a piezoelectric stack A, ctuator has been developed to describe ...
Piezoceramics are potential sensors and actuators for a wide range of applications in smart structur...
Micro-manipulation is extremely challenging as it requires high repeatability of the system, as well...
To successfully exploit the full potential of piezoelectric actuators in micro/nano positioning syst...
This paper presents Bouc-Wen hysteresis modelling and tracking control of piezoelectric stack APA120...
This paper presents the development and initial results of a controller based on a novel rate-depend...
Piezoelectric actuators are widely used in the field of micro- and nanopositioning due to their high...
Atomic force microscopes offer the possibility for imaging a sample topography with accuracy in the ...
This paper presents the research work on a 1 degree of freedom (DOF) force reflecting tele-micromani...
International audienceThis paper presents the characterization, modeling and precise control of a 2-...
International audienceThis article investigates precise positioning at the micrometer scale using pi...
Piezoelectric actuator (PEA) is an ideal microscale and nanoscale actuator because of its ultra-prec...
In this paper an open-loop actuation strategy based on a Prandtl-Ishlinskii hysteresis model is appl...
The manipulation of samples in atomic force microscopes (AFMs) is often performed using piezoelectri...