Roentgentarget

WO 2009098027 A1 UPAB: 20090902 NOVELTY - X-rays (110) from an electron beam (120) impinge with an angle of incidence (M) on an X-ray target with a source layer (130) having a high atomic number and a substrate (140) with a low atomic number. The source layer is in contact with the substrate having a thickness (D) in the direction of the surface Normal (150) in the region of incidence of at least 1 cm. DETAILED DESCRIPTION - The substrate thickness is preferably at least 1.5 cm thick or more. The X-ray impingement area is 1 to 500 microns wide. The X-ray source layer (130) is molybdenum, gold, platinum or tungsten. The substrate is beryllium, graphite, diamond or silicon carbide. USE - X-ray target for non-destructive materials testing. ADVANTAGE - The X-ray target has large-volume electron distribution and associated heat distribution