Continuous functional wet coating provides polymer films with additional functional properties. The industrial application requires powerful quality control, which can be achieved by in-line characterization of the coating thickness with optical spectroscopy directly on the coating equipment. To implement this concept, at first, model films were used to determine the optical parameters of the coatings. We have shown that thickness measurement is possible by using the intensities of molecular oscillation in the infrared spectral region as well as by thickness interferences in the visible and near infrared spectral region. For integration into the industrial coating unit, interferences in the near infrared region were selected and measured on...
In recent years it has been observed that the thickness of a polymer film deposited on glass substra...
A new optical monitoring system has been developed that allows recording of transmission spectra in ...
Abstract A set of simple methodologies is presented so that optical parameters relevant to 10.6 μm C...
Near-infrared spectroscopy has been applied to determine the water content of plastic lenses. An ana...
The thickness characterization of transparent protective coatings on functional, transparent materia...
The thickness characterization of transparent protective coatings on functional, transparent materia...
Optical coatings on plastics were studied for improving scratch resistance and reducing water absorp...
During the manufacturing of printed electronic circuits, different layers of coatings are applied su...
The Fraunhofer Institute for Process Engineering and Packaging IVV and the The Fraunhofer Institute ...
Thin organic films are used in a wide variety of applications, from membranes to microelectronics. W...
High-transparency polymers, called optical polymers (OPs), are used in many thin-film devices, for w...
This work deals generally with surface diagnostic and optical properties of thin layers which are cr...
Flat materials manufacturing industries need on-line measurement systems which make features control...
The coating selected in this research was a film-forming low-gloss wood lacquer for outdoors (Transp...
A near-infrared spectroscopic method and measurement system for moisture depth profiling is presente...
In recent years it has been observed that the thickness of a polymer film deposited on glass substra...
A new optical monitoring system has been developed that allows recording of transmission spectra in ...
Abstract A set of simple methodologies is presented so that optical parameters relevant to 10.6 μm C...
Near-infrared spectroscopy has been applied to determine the water content of plastic lenses. An ana...
The thickness characterization of transparent protective coatings on functional, transparent materia...
The thickness characterization of transparent protective coatings on functional, transparent materia...
Optical coatings on plastics were studied for improving scratch resistance and reducing water absorp...
During the manufacturing of printed electronic circuits, different layers of coatings are applied su...
The Fraunhofer Institute for Process Engineering and Packaging IVV and the The Fraunhofer Institute ...
Thin organic films are used in a wide variety of applications, from membranes to microelectronics. W...
High-transparency polymers, called optical polymers (OPs), are used in many thin-film devices, for w...
This work deals generally with surface diagnostic and optical properties of thin layers which are cr...
Flat materials manufacturing industries need on-line measurement systems which make features control...
The coating selected in this research was a film-forming low-gloss wood lacquer for outdoors (Transp...
A near-infrared spectroscopic method and measurement system for moisture depth profiling is presente...
In recent years it has been observed that the thickness of a polymer film deposited on glass substra...
A new optical monitoring system has been developed that allows recording of transmission spectra in ...
Abstract A set of simple methodologies is presented so that optical parameters relevant to 10.6 μm C...