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microscopeAgent
photonScientist
Time resolved photon emission (TRE) has the potential to identify faults by analysing the emission as a function of time. TRE detectors provide time capabilities, but at the detriment of the spatial information. In order to localize the emission source (switching transistors), it is interesting to couple TRE with light emission microscopes. Based on a comparison of commercial TRE detectors and photon counting electronic modules, we present a cost effective implementation of TRE into a commercial microscope, with no hardware modifications
The renewal of interest in Time of Flight Positron Emission Tomography (TOF-PET), as well as the nec...
Fluorescence laser-scanning microscopy (LSM) is experiencing a revolution thanks to the introduction...
When optimizing the timing performance of a time-of-flight positron emission tomography (TOF-PET) de...
Time resolved photon emission (TRE) has the potential to identify faults by analysing the emission a...
A Scanning Time-Resolved Emission (S-TRE) microscope or system includes an optical system configured...
In this paper, we describe a fault localization strategy for scan designs based on Time Resolved Pho...
Semiconductor devices that are not generally thought of as light sources do emit radiation in the vi...
We have investigated the use of a Timepix detector as a method for increasing the realisable tempora...
Spiecker H, Schmidt O, Ziethen C, et al. Time-of-flight photoelectron emission microscopy TOF-PEEM: ...
In this study, we describe a time-correlated single photon counting (TCSPC) technique for multi-wave...
Fast frame rale CMOS cameras in combination with photon counting intensifiers can be used for fluore...
Time-Correlated Single Photon Counting (TCSPC) represents a fundamental tool for the investigation o...
The advent of high timing resolution (<50ps) single photon avalanche diodes (SPADs) and progresses i...
Stimulated emission depletion (STED) microscopy based on time-gated detection is a straightforward i...
We report on a novel two-photon excitation stimulated emission depletion (2PE-STED) microscope based...
The renewal of interest in Time of Flight Positron Emission Tomography (TOF-PET), as well as the nec...
Fluorescence laser-scanning microscopy (LSM) is experiencing a revolution thanks to the introduction...
When optimizing the timing performance of a time-of-flight positron emission tomography (TOF-PET) de...
Time resolved photon emission (TRE) has the potential to identify faults by analysing the emission a...
A Scanning Time-Resolved Emission (S-TRE) microscope or system includes an optical system configured...
In this paper, we describe a fault localization strategy for scan designs based on Time Resolved Pho...
Semiconductor devices that are not generally thought of as light sources do emit radiation in the vi...
We have investigated the use of a Timepix detector as a method for increasing the realisable tempora...
Spiecker H, Schmidt O, Ziethen C, et al. Time-of-flight photoelectron emission microscopy TOF-PEEM: ...
In this study, we describe a time-correlated single photon counting (TCSPC) technique for multi-wave...
Fast frame rale CMOS cameras in combination with photon counting intensifiers can be used for fluore...
Time-Correlated Single Photon Counting (TCSPC) represents a fundamental tool for the investigation o...
The advent of high timing resolution (<50ps) single photon avalanche diodes (SPADs) and progresses i...
Stimulated emission depletion (STED) microscopy based on time-gated detection is a straightforward i...
We report on a novel two-photon excitation stimulated emission depletion (2PE-STED) microscope based...
The renewal of interest in Time of Flight Positron Emission Tomography (TOF-PET), as well as the nec...
Fluorescence laser-scanning microscopy (LSM) is experiencing a revolution thanks to the introduction...
When optimizing the timing performance of a time-of-flight positron emission tomography (TOF-PET) de...
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