We describe a modular detector system suitable to intercept the diffracted x-ray radiation (Debye–Scherrer rings) in a transmission geometry setup at monochromatic tunable synchrotron radiation beamlines. The detector consists of several independent channels composed of a motorized front slit and a rear detector slit system which can be mounted in either a vertical or a horizontal configuration. The detectors are placed at fixed scattering angles 2θ and the diffraction scan is performed by tuning the monochromator energy. The availability of a multidetector system allows one to cover a wide range of scattering vectors with limited range energy scans. The photon sensitive elements are based on CdZnTe solid state detectors which are used at a...
X-ray powder diffraction measurements using synchrotron radiation are currently being carried out on...
The detection module of the ARDESIA spectrometer, an SDD-based, multichannel X-ray detector is prese...
An instrument is described which allows for texture-sensitive energy dispersive X-ray diffraction on...
We describe a modular detector system suitable to intercept the diffracted x-ray radiation (Debye-Sc...
The multi-crystal analyzer detector system has two beam limiting devices, two collimators (2,3) and ...
Diffraction and spectroscopy instruments using a filtering process with several analyser crystals ha...
The high-resolution powder diffraction beamline at ESRF (ID22), built with a dual-undulator source o...
For high-resolution powder diffraction in material science, high photon energies are necessary, espe...
We describe the development and use of a new type of position sensitive x-ray detector for synchrotr...
Bisher waren für höchstauflösende Pulver-Beugungsexperimente lange Messzeiten an teuren Synchrotronq...
The instrumentation developed for polycrystalline diffractometry using the storage ring at the Stanf...
The J. Bennett Johnston, Sr., Center for Advanced Microstructures and Devices (CAMD) is a synchrotro...
This station is used for X-ray powder diffraction experiments using a monochromatized X-ray. The bea...
Powder diffraction covers a variety of applications ranging from highresolution structure determinat...
Diffraction instruments using filtering by one or several analyser crystals exist since the 1980s an...
X-ray powder diffraction measurements using synchrotron radiation are currently being carried out on...
The detection module of the ARDESIA spectrometer, an SDD-based, multichannel X-ray detector is prese...
An instrument is described which allows for texture-sensitive energy dispersive X-ray diffraction on...
We describe a modular detector system suitable to intercept the diffracted x-ray radiation (Debye-Sc...
The multi-crystal analyzer detector system has two beam limiting devices, two collimators (2,3) and ...
Diffraction and spectroscopy instruments using a filtering process with several analyser crystals ha...
The high-resolution powder diffraction beamline at ESRF (ID22), built with a dual-undulator source o...
For high-resolution powder diffraction in material science, high photon energies are necessary, espe...
We describe the development and use of a new type of position sensitive x-ray detector for synchrotr...
Bisher waren für höchstauflösende Pulver-Beugungsexperimente lange Messzeiten an teuren Synchrotronq...
The instrumentation developed for polycrystalline diffractometry using the storage ring at the Stanf...
The J. Bennett Johnston, Sr., Center for Advanced Microstructures and Devices (CAMD) is a synchrotro...
This station is used for X-ray powder diffraction experiments using a monochromatized X-ray. The bea...
Powder diffraction covers a variety of applications ranging from highresolution structure determinat...
Diffraction instruments using filtering by one or several analyser crystals exist since the 1980s an...
X-ray powder diffraction measurements using synchrotron radiation are currently being carried out on...
The detection module of the ARDESIA spectrometer, an SDD-based, multichannel X-ray detector is prese...
An instrument is described which allows for texture-sensitive energy dispersive X-ray diffraction on...