Monitoring antiferromagnetism via angle-resolved Auger photoelectron coincidence spectroscopy:The case of NiO/Ag(001)

""Spin selectivity in angle-resolved Auger photoelectron coincidence spectroscopy (AR-APECS) is used to. probe electronic structure in antiferromagnetic thin films. In particular, exploiting the AR-APECS capability to. discriminate Auger electron emission events characterized by a different spin of the ion in its final state, a sharp. multiplet structure in the Ni MVV Auger line shape of NiO\\\/Ag(001) thin films is measured below the critical. Néel temperature. The assignment of multiplet terms follows from a close comparison of the experimental. AR-APECS line shapes with the predictions based on semiempirical calculations on a cluster model and an. open-band extension of the Cini-Sawatzky approach. In analogy to CoO, also in NiO, above the Néel temperature. a more featureless Auger spectrum appears and AR-APECS does not disentangle anymore high-spin and low-spin. contributions to the total Auger intensity. Such a behavior, which seems to be a general result for metal oxide. antiferromagnetic systems, is discussed."