A state-of-the-art Monte Carlo simulator is applied to the investigation of the radio-frequency performance of bulk and ultrathin-body single-gate SOI MOSFETs that are designed according to the prescriptions of the 2005 ITRS for analog and mixed-signal applications. We provide an analysis of the signal-delay buildup along the channel and an investigation of the scaling properties of the parameters of the ac equivalent circuit, the transition frequency, and the 3-dB bandwidth of the voltage gain in common-source configuration. A comparison with a standard drift-diffusion approach is presented in order to discuss the main differences between the two transport models in terms of high-frequency ac analysis
The design of nanoscale CMOS devices poses new challenges to the TCAD community. The potential advan...
Recent developments in the Monte Carlo method for the simulation of semi-classical carrier transport...
A conventional Monte-Carlo simulator has been extended to include electrostatic and transport effect...
A state of the art Monte-Carlo simulator is applied to the investigation of the RF performance of Bu...
A state of the art Monte-Carlo simulator is applied to the investigation of the RF performance of bu...
In this work, a Monte-Carlo simulator including the most relevant scattering mechanisms and quantum...
A time-dependent simulation procedure has been implemented in a state of the art Monte Carlo device ...
A time-dependent simulation procedure has been implemented in a state of the art Monte-Carlo device ...
Multiple-gate SOI MOSFETs are potential candidates for achieving the performance expectations of th...
MOSFET radio-frequency characterization and modeling is studied, both with SOI CMOS and bulk CMOS te...
Full-band Monte Carlo simulation of short-channel Double-Gate SOI MOSFETs were used to assess possib...
The novel probabilistic models of the random variations in nanoscale MOSFET's high frequency perform...
A Monte Carlo investigation of the dynamic performance of nano-scale ultra-thin-body (UTB) Schottky-...
A Monte Carlo investigation of the dynamic performance of nano-scale ultra-thin-body (UTB) Schottky-...
We present a submicron RF fully-depleted SOI MOSFET macro-model based on a complete extrinsic small-...
The design of nanoscale CMOS devices poses new challenges to the TCAD community. The potential advan...
Recent developments in the Monte Carlo method for the simulation of semi-classical carrier transport...
A conventional Monte-Carlo simulator has been extended to include electrostatic and transport effect...
A state of the art Monte-Carlo simulator is applied to the investigation of the RF performance of Bu...
A state of the art Monte-Carlo simulator is applied to the investigation of the RF performance of bu...
In this work, a Monte-Carlo simulator including the most relevant scattering mechanisms and quantum...
A time-dependent simulation procedure has been implemented in a state of the art Monte Carlo device ...
A time-dependent simulation procedure has been implemented in a state of the art Monte-Carlo device ...
Multiple-gate SOI MOSFETs are potential candidates for achieving the performance expectations of th...
MOSFET radio-frequency characterization and modeling is studied, both with SOI CMOS and bulk CMOS te...
Full-band Monte Carlo simulation of short-channel Double-Gate SOI MOSFETs were used to assess possib...
The novel probabilistic models of the random variations in nanoscale MOSFET's high frequency perform...
A Monte Carlo investigation of the dynamic performance of nano-scale ultra-thin-body (UTB) Schottky-...
A Monte Carlo investigation of the dynamic performance of nano-scale ultra-thin-body (UTB) Schottky-...
We present a submicron RF fully-depleted SOI MOSFET macro-model based on a complete extrinsic small-...
The design of nanoscale CMOS devices poses new challenges to the TCAD community. The potential advan...
Recent developments in the Monte Carlo method for the simulation of semi-classical carrier transport...
A conventional Monte-Carlo simulator has been extended to include electrostatic and transport effect...