As feature size is scaling down, dynamic power consumption reduces but static power consumption increases. Due to the increase of static power, leakage currents as a source, the information can be exploited successfully as a side-channel to recover the secrets of the cryptographic implementations. An attacker who has access to the hardware fabrication can insert a Trojan to the design to steal or alter information. In this thesis, a post-fab static voltage variation/detection technique is developed to detect the potential fabrication process Trojan insertion. The technique is, dividing the designed circuit into N equal segments, where each segment would have same leakage current under certain input patterns. One-ohm resistor is embedded bet...
As a result of the globalisation of the semiconductor design and fabrication processes, integrated c...
In this work we focus on Power Analysis Attacks (PAAs) which exploit the dependence of the static cu...
Semiconductor technology scaling faced tough engineering challenges while moving towards and beyond ...
With the globalization of integrated circuit design and fabrication process, the main concerned issu...
Abstract—Two major security challenges for integrated circuits (IC) that involve encryption cores ar...
The outsourcing of the manufacturing process of integrated circuits to fabrications plants all over ...
The use of side-channel measurements and fingerprinting, in conjunction with statistical analysis, h...
The static power consumption of modern CMOS devices has become a substantial concern in the context ...
Abstract—Hardware Trojan attack in the form of malicious modification of a design has emerged as a m...
Abstract. By shrinking the technology static power consumption of CMOS circuits is becoming a major ...
Latest nanometer CMOS technology nodes have highlighted new issues in security of cryptographic hard...
In today's technologies, it is critical to monitor power supply variations due to their negative imp...
There is a general consensus that contemporary electronics are at risk of cyber-attacks or malicious...
In this paper, various aspects related to Leakage Power Analysis (LPA) attacks to cryptographic circ...
Non-invasive side-channel attacks (SCA) are powerful attacks which can be used to obtain the secret ...
As a result of the globalisation of the semiconductor design and fabrication processes, integrated c...
In this work we focus on Power Analysis Attacks (PAAs) which exploit the dependence of the static cu...
Semiconductor technology scaling faced tough engineering challenges while moving towards and beyond ...
With the globalization of integrated circuit design and fabrication process, the main concerned issu...
Abstract—Two major security challenges for integrated circuits (IC) that involve encryption cores ar...
The outsourcing of the manufacturing process of integrated circuits to fabrications plants all over ...
The use of side-channel measurements and fingerprinting, in conjunction with statistical analysis, h...
The static power consumption of modern CMOS devices has become a substantial concern in the context ...
Abstract—Hardware Trojan attack in the form of malicious modification of a design has emerged as a m...
Abstract. By shrinking the technology static power consumption of CMOS circuits is becoming a major ...
Latest nanometer CMOS technology nodes have highlighted new issues in security of cryptographic hard...
In today's technologies, it is critical to monitor power supply variations due to their negative imp...
There is a general consensus that contemporary electronics are at risk of cyber-attacks or malicious...
In this paper, various aspects related to Leakage Power Analysis (LPA) attacks to cryptographic circ...
Non-invasive side-channel attacks (SCA) are powerful attacks which can be used to obtain the secret ...
As a result of the globalisation of the semiconductor design and fabrication processes, integrated c...
In this work we focus on Power Analysis Attacks (PAAs) which exploit the dependence of the static cu...
Semiconductor technology scaling faced tough engineering challenges while moving towards and beyond ...