In this work we focus on Power Analysis Attacks (PAAs) which exploit the dependence of the static current of sub- 50nm CMOS integrated circuits on the internally processed data. Spice level simulations of static current as a function of the input state have been carried out to show that static power consumption of nanometer logic gates continues to exhibit a strong dependence on input vector even for sub-50nm circuits and that the coefficient of variation for a nand gate is strongly increasing with the scaling of CMOS technology. We demonstrate that it is possible to recover the secret key of a cryptographic core by exploiting this data dependence by means of different statistical distinguishers. For the first time in the literature we form...
With the continuous scaling of CMOS technology, which has now reached the 3 nm nodeat production lev...
This paper discusses a general model of differential power analysis (DPA) attacks to static logic ci...
The imbalance of the currents leaked by CMOS standard cells when different logic values are applied ...
In this paper, a novel class of power analysis attacks to cryptographic circuits is presented. These...
Latest nanometer CMOS technology nodes have highlighted new issues in security of cryptographic hard...
In this work, the implementation of the PRESENT-80 block cipher in a 40nm CMOS technology, and its v...
In this paper, attacks aiming at recovering the secret key of a cryptographic core from measurements...
Since the protection of sensible data is considered a major concern in modern devices, the importanc...
Vulnerability of cryptographic devices to side-channel analysis attacks, and in particular power ana...
In this paper, various aspects related to Leakage Power Analysis (LPA) attacks to cryptographic circ...
Abstract. By shrinking the technology static power consumption of CMOS circuits is becoming a major ...
Static power consumption is an increasingly important concern when designing circuits in deep submic...
The static power consumption of modern CMOS devices has become a substantial concern in the context ...
With the continuous scaling of CMOS technology, which has now reached the 3 nm node at production le...
The imbalance of the currents leaked by CMOS standard cells when different logic values are applied ...
With the continuous scaling of CMOS technology, which has now reached the 3 nm nodeat production lev...
This paper discusses a general model of differential power analysis (DPA) attacks to static logic ci...
The imbalance of the currents leaked by CMOS standard cells when different logic values are applied ...
In this paper, a novel class of power analysis attacks to cryptographic circuits is presented. These...
Latest nanometer CMOS technology nodes have highlighted new issues in security of cryptographic hard...
In this work, the implementation of the PRESENT-80 block cipher in a 40nm CMOS technology, and its v...
In this paper, attacks aiming at recovering the secret key of a cryptographic core from measurements...
Since the protection of sensible data is considered a major concern in modern devices, the importanc...
Vulnerability of cryptographic devices to side-channel analysis attacks, and in particular power ana...
In this paper, various aspects related to Leakage Power Analysis (LPA) attacks to cryptographic circ...
Abstract. By shrinking the technology static power consumption of CMOS circuits is becoming a major ...
Static power consumption is an increasingly important concern when designing circuits in deep submic...
The static power consumption of modern CMOS devices has become a substantial concern in the context ...
With the continuous scaling of CMOS technology, which has now reached the 3 nm node at production le...
The imbalance of the currents leaked by CMOS standard cells when different logic values are applied ...
With the continuous scaling of CMOS technology, which has now reached the 3 nm nodeat production lev...
This paper discusses a general model of differential power analysis (DPA) attacks to static logic ci...
The imbalance of the currents leaked by CMOS standard cells when different logic values are applied ...