Normal incidence argon-copper sputtering mechanisms have been investigated for ion energies just above threshold. Identical mechanisms operate in both the (111) and (001) surface orientations. Adsorption of an ordered oxygen overlay on the surface does not destroy the ejection processes. Although the mechanisms produce similar ejected atom energy distributions, the processes may be experimentally distinguishable through the angular emission spectrum of the ejected copper atoms
Sputtering of Cu single-crystal, polycrystal and amorphous targets by 5 keV Ar ions has been studied...
The article of record as published may be found at http://dx.doi.org/10.1016/0039-6028(79)90172-9The...
Molecular dynamics simulations were used to investigate the mechanisms responsible for the sputterin...
The sputtering mechanisms of monocrystalline Cu are studied using the binary-collision lattice-simul...
The article of record as published may be found at http://dx.doi.org/10.1080/00337578508222508The en...
A simple model is given for calculating the sputtering yield of single crystals as a function of the...
Sputtering of Cu single-crystal, polycrystal and amorphous targets by 5 keV Ar ions has been studied...
The article of record as published may be found at https://doi.org/10.1080/00337577308232613The conc...
The sputtering of Cu atoms from liquid targets by normally incident 5 keV Ar^+ ions was simulated us...
The sputtering of Cu atoms from liquid targets by normally incident 5 keV Ar^+ ions was simulated us...
Non-resonant multiphoton ionization combined with quadrupole and time-of-flight analysis has been us...
Sputtering of Cu targets by 5 keV Ar ions has been studied by the binary collision lattice simulatio...
The multiple interaction (MI) codes SPUT1 and SPUT2 have been used to investigate, the penetration o...
The multiple interaction (MI) codes SPUT1 and SPUT2 have been used to investigate, the penetration o...
Sputter removal of thin overlayers of Cu on Si was studied using high-resolution Rutherford backscat...
Sputtering of Cu single-crystal, polycrystal and amorphous targets by 5 keV Ar ions has been studied...
The article of record as published may be found at http://dx.doi.org/10.1016/0039-6028(79)90172-9The...
Molecular dynamics simulations were used to investigate the mechanisms responsible for the sputterin...
The sputtering mechanisms of monocrystalline Cu are studied using the binary-collision lattice-simul...
The article of record as published may be found at http://dx.doi.org/10.1080/00337578508222508The en...
A simple model is given for calculating the sputtering yield of single crystals as a function of the...
Sputtering of Cu single-crystal, polycrystal and amorphous targets by 5 keV Ar ions has been studied...
The article of record as published may be found at https://doi.org/10.1080/00337577308232613The conc...
The sputtering of Cu atoms from liquid targets by normally incident 5 keV Ar^+ ions was simulated us...
The sputtering of Cu atoms from liquid targets by normally incident 5 keV Ar^+ ions was simulated us...
Non-resonant multiphoton ionization combined with quadrupole and time-of-flight analysis has been us...
Sputtering of Cu targets by 5 keV Ar ions has been studied by the binary collision lattice simulatio...
The multiple interaction (MI) codes SPUT1 and SPUT2 have been used to investigate, the penetration o...
The multiple interaction (MI) codes SPUT1 and SPUT2 have been used to investigate, the penetration o...
Sputter removal of thin overlayers of Cu on Si was studied using high-resolution Rutherford backscat...
Sputtering of Cu single-crystal, polycrystal and amorphous targets by 5 keV Ar ions has been studied...
The article of record as published may be found at http://dx.doi.org/10.1016/0039-6028(79)90172-9The...
Molecular dynamics simulations were used to investigate the mechanisms responsible for the sputterin...