textThe quest for smaller and faster integrated circuits (ICs) continues, but traditional photolithography, the patterning process used to fabricate them, is rapidly approaching its physical limits. Step and Flash Imprint Lithography (S-FIL®) is a low-cost patterning technique which has shown great potential for next generation semiconductor manufacturing. To date, all methods of imprint lithography have utilized a sacrificial resist to produce device features. Our goal has been to develop functional materials such as insulators that can be directly patterned by S-FIL and then remain as a part of the end product. Directly patternable dielectric (DPD) materials must meet multiple mechanical and physical requirements for application in microe...
textIn 1960's Gordon Moore predicted that the increase in the number of components in integrated cir...
textThis thesis discusses two patterning techniques: Step and Flash Imprint Lithography, a nanoimpri...
textThe microelectronics industry strives for continued reduction in feature sizes to allow increase...
textThe quest for smaller and faster integrated circuits (ICs) continues, but traditional photolitho...
textStep-Flash Imprint Lithography (S-FIL[trademark]) is a low-cost, high-resolution, high-throughpu...
textStep and Flash Imprint Lithography (S-FIL) is a high resolution, next-generation lithography tec...
textStep and Flash Imprint Lithography (S-FIL) is a high resolution, next-generation lithography tec...
textStep and flash imprint lithography (SFIL) is a relatively new technique for patterning high-res...
textStep and flash imprint lithography (SFIL) is a relatively new technique for patterning high-res...
The goal of the Step and Flash Imprint Lithography (SFIL) development program is to enable patternin...
textStep and Flash Imprint Lithography (SFIL) is a next generation lithography option that has beco...
The goal of the SFIL development program is to enable patterning of sub-100 nm features at room temp...
textStep and Flash Imprint Lithography (SFIL) is an attractive method for patterning sub-100 nm geo...
textStep and flash imprint lithography (SFIL) was developed in 1999 at The University of Texas at Au...
textIn 1960's Gordon Moore predicted that the increase in the number of components in integrated cir...
textIn 1960's Gordon Moore predicted that the increase in the number of components in integrated cir...
textThis thesis discusses two patterning techniques: Step and Flash Imprint Lithography, a nanoimpri...
textThe microelectronics industry strives for continued reduction in feature sizes to allow increase...
textThe quest for smaller and faster integrated circuits (ICs) continues, but traditional photolitho...
textStep-Flash Imprint Lithography (S-FIL[trademark]) is a low-cost, high-resolution, high-throughpu...
textStep and Flash Imprint Lithography (S-FIL) is a high resolution, next-generation lithography tec...
textStep and Flash Imprint Lithography (S-FIL) is a high resolution, next-generation lithography tec...
textStep and flash imprint lithography (SFIL) is a relatively new technique for patterning high-res...
textStep and flash imprint lithography (SFIL) is a relatively new technique for patterning high-res...
The goal of the Step and Flash Imprint Lithography (SFIL) development program is to enable patternin...
textStep and Flash Imprint Lithography (SFIL) is a next generation lithography option that has beco...
The goal of the SFIL development program is to enable patterning of sub-100 nm features at room temp...
textStep and Flash Imprint Lithography (SFIL) is an attractive method for patterning sub-100 nm geo...
textStep and flash imprint lithography (SFIL) was developed in 1999 at The University of Texas at Au...
textIn 1960's Gordon Moore predicted that the increase in the number of components in integrated cir...
textIn 1960's Gordon Moore predicted that the increase in the number of components in integrated cir...
textThis thesis discusses two patterning techniques: Step and Flash Imprint Lithography, a nanoimpri...
textThe microelectronics industry strives for continued reduction in feature sizes to allow increase...