In high-purity GaN grown by hydride vapor phase epitaxy, the commonly observed yellow luminescence (YL) band gives way to a green luminescence (GL) band at high excitation intensity. We propose that the GL band with a maximum at 2.4 eV is caused by transitions of electrons from the conduction band to the 0/+ level of the isolated CN defect. The YL band, related to transitions via the −/0 level of the same defect, has a maximum at 2.1 eV and can be observed only for some high-purity samples. However, in less pure GaN samples, where no GL band is observed, another YL band with a maximum at 2.2 eV dominates the photoluminescence spectrum. The latter is attributed to the CNON complex
Yellow luminescence (YL) of unintentionally doped GaN (u-GaN) peaking at about 2.2 eV has been inves...
In this paper we show that the origin of the yellow luminescence band in GaN and the green luminesce...
The concentration of the acceptor responsible for the yellow luminescence (YL) band at about 2.2eV i...
A majority of the point defects in GaN that are responsible for broad photoluminescence (PL) bands r...
A majority of the point defects in GaN that are responsible for broad photoluminescence (PL) bands r...
Photoluminescence of the dominant deep-level acceptor in high-purity freestanding GaN is studied ove...
We have studied a broad photoluminescence band in high-mobility freestanding 200-μm-thick GaN templa...
Many point defects in GaN responsible for broad photoluminescence (PL) bands remain unidentified. Th...
We have investigated point defects in GaN grown by HVPE by using steady-state and time-resolved phot...
The influence of ion-beam-produced lattice defects as well as H, B, C, N, O, and Si, introduced by ...
The authors observed a drastic reduction of the yellow luminescence (YL) intensity in carbon-doped s...
Hydride vapor phase epitaxy (HVPE) is used for the growth of low-defect GaN. We have grown undoped f...
A majority of the point defects in GaN that are responsible for broad photoluminescence (PL) bands r...
Deep level defects responsible for the 2.4 eV photoluminescence (PL) band in a freestanding GaN temp...
Yellow luminescence (YL) of unintentionally doped GaN (u-GaN) peaking at about 2.2 eV has been inves...
Yellow luminescence (YL) of unintentionally doped GaN (u-GaN) peaking at about 2.2 eV has been inves...
In this paper we show that the origin of the yellow luminescence band in GaN and the green luminesce...
The concentration of the acceptor responsible for the yellow luminescence (YL) band at about 2.2eV i...
A majority of the point defects in GaN that are responsible for broad photoluminescence (PL) bands r...
A majority of the point defects in GaN that are responsible for broad photoluminescence (PL) bands r...
Photoluminescence of the dominant deep-level acceptor in high-purity freestanding GaN is studied ove...
We have studied a broad photoluminescence band in high-mobility freestanding 200-μm-thick GaN templa...
Many point defects in GaN responsible for broad photoluminescence (PL) bands remain unidentified. Th...
We have investigated point defects in GaN grown by HVPE by using steady-state and time-resolved phot...
The influence of ion-beam-produced lattice defects as well as H, B, C, N, O, and Si, introduced by ...
The authors observed a drastic reduction of the yellow luminescence (YL) intensity in carbon-doped s...
Hydride vapor phase epitaxy (HVPE) is used for the growth of low-defect GaN. We have grown undoped f...
A majority of the point defects in GaN that are responsible for broad photoluminescence (PL) bands r...
Deep level defects responsible for the 2.4 eV photoluminescence (PL) band in a freestanding GaN temp...
Yellow luminescence (YL) of unintentionally doped GaN (u-GaN) peaking at about 2.2 eV has been inves...
Yellow luminescence (YL) of unintentionally doped GaN (u-GaN) peaking at about 2.2 eV has been inves...
In this paper we show that the origin of the yellow luminescence band in GaN and the green luminesce...
The concentration of the acceptor responsible for the yellow luminescence (YL) band at about 2.2eV i...