10.1109/TIM.2003.815987IEEE Transactions on Instrumentation and Measurement5241136-1142IEIM
An instrument which measures temperature in connection with the development of rocket payload for th...
This article describes the measuring system and the influence of selected factors on the accuracy of...
Semiconductor processing temperatures are currently measured using either py-rometers or thermocoupl...
Conference Record - IEEE Instrumentation and Measurement Technology Conference1843-848CRII
10.1117/12.772719Proceedings of SPIE - The International Society for Optical Engineering6922-PSIS
10.1109/TSM.2007.890770IEEE Transactions on Semiconductor Manufacturing2015-12ITSM
Additive manufacturing (AM) is important in industrial and economical domains but still lacking pro...
Real time temperature measurements have been performed on both GaAs and silicon substrates during wa...
Temperature variation can significantly impact dimensional measurements, and therefore many modern d...
10.1109/IMTC.2004.1351183Conference Record - IEEE Instrumentation and Measurement Technology Confere...
The value of a semiconductor’s diode temperature determines the correct operation of this element an...
Herein, an inline IR thermography system as an innovative application for real‐time contactless temp...
AbstractWe developed a unique acousto-optic imaging system for in-situ measurement of high temperatu...
It is well known that the efficiency of a photovoltaic (PV) module is strongly impacted by its tempe...
A temperature reference system for calibrating fluorescence-based sensors was developed. The system ...
An instrument which measures temperature in connection with the development of rocket payload for th...
This article describes the measuring system and the influence of selected factors on the accuracy of...
Semiconductor processing temperatures are currently measured using either py-rometers or thermocoupl...
Conference Record - IEEE Instrumentation and Measurement Technology Conference1843-848CRII
10.1117/12.772719Proceedings of SPIE - The International Society for Optical Engineering6922-PSIS
10.1109/TSM.2007.890770IEEE Transactions on Semiconductor Manufacturing2015-12ITSM
Additive manufacturing (AM) is important in industrial and economical domains but still lacking pro...
Real time temperature measurements have been performed on both GaAs and silicon substrates during wa...
Temperature variation can significantly impact dimensional measurements, and therefore many modern d...
10.1109/IMTC.2004.1351183Conference Record - IEEE Instrumentation and Measurement Technology Confere...
The value of a semiconductor’s diode temperature determines the correct operation of this element an...
Herein, an inline IR thermography system as an innovative application for real‐time contactless temp...
AbstractWe developed a unique acousto-optic imaging system for in-situ measurement of high temperatu...
It is well known that the efficiency of a photovoltaic (PV) module is strongly impacted by its tempe...
A temperature reference system for calibrating fluorescence-based sensors was developed. The system ...
An instrument which measures temperature in connection with the development of rocket payload for th...
This article describes the measuring system and the influence of selected factors on the accuracy of...
Semiconductor processing temperatures are currently measured using either py-rometers or thermocoupl...