Aluminum nitride (AlN) has subjected adjoin in formation of state-of-the-art high-current p-channel FETs, mature filter and advanced waveguide fabrication within all monolithic integrated scope e.g., arrange of constitutive as AlN/GaN/AlN high-electron-mobility transistors (HEMT). Subjective of high-power mm wave achieve has operated by gallium nitride (GaN) HEMTs, so forth further interpose into conventional metal-polar AlGaN/GaN heterostructures has arose efficacy from electric field-shaping metal plates that has been to allow Zener breakdown performance of GaN. Plasma-enhanced atomic layer polycrystalline deposition (PEALD) and subsequent in-situ atomic layer annealing (ALA) has grown AlN films on Si and Si substrates at low temperature. ...
The AlxIn1-xN barrier high electron mobility transistor (HEMT) structure has been optimized with var...
A1. X-ray diffraction A1. Transmission electron microscopy A3. Molecular beam epitaxy B3. High elect...
AlN/GaN high electron mobility transistor (HEMT) structures with a 3.5 nm AlN barrier were grown wit...
185 pagesGallium nitride high-electron-mobility transistors (GaN HEMTs) are at a point of rapid grow...
The industrial level technologies including molecular beam epitaxy and submicron planar processing a...
To continue the miniaturization trend of Silicon (Si)-based microelectronic devices in an era when w...
The III-Nitrides were intensively studied during the last few years due to its tunable band gap rang...
Aluminum nitride (AlN) films have been grown using novel technological approaches based on plasma-en...
Developing an effective passivation technique for AlGaN/GaN high-electron-mobility transistors (HEMT...
Gallium nitride based High Electron Mobility Transistors (HEMT) with ultra-thin AlN barriers are dev...
This dissertation details the synthesis, characterization, and application of low-pressure chemical ...
Abstract We report a low current collapse GaN-based high electron mobility transistor (HEMT) with an...
Binary AlN/GaN high electron mobility transistors (HEMTs) were grown by plasma-assisted molecular be...
Gallium nitride (GaN) based technology has been heavily researched over the past two decades due to ...
The recent development of low dislocation density Aluminum Nitride (AlN) substrates allows the reali...
The AlxIn1-xN barrier high electron mobility transistor (HEMT) structure has been optimized with var...
A1. X-ray diffraction A1. Transmission electron microscopy A3. Molecular beam epitaxy B3. High elect...
AlN/GaN high electron mobility transistor (HEMT) structures with a 3.5 nm AlN barrier were grown wit...
185 pagesGallium nitride high-electron-mobility transistors (GaN HEMTs) are at a point of rapid grow...
The industrial level technologies including molecular beam epitaxy and submicron planar processing a...
To continue the miniaturization trend of Silicon (Si)-based microelectronic devices in an era when w...
The III-Nitrides were intensively studied during the last few years due to its tunable band gap rang...
Aluminum nitride (AlN) films have been grown using novel technological approaches based on plasma-en...
Developing an effective passivation technique for AlGaN/GaN high-electron-mobility transistors (HEMT...
Gallium nitride based High Electron Mobility Transistors (HEMT) with ultra-thin AlN barriers are dev...
This dissertation details the synthesis, characterization, and application of low-pressure chemical ...
Abstract We report a low current collapse GaN-based high electron mobility transistor (HEMT) with an...
Binary AlN/GaN high electron mobility transistors (HEMTs) were grown by plasma-assisted molecular be...
Gallium nitride (GaN) based technology has been heavily researched over the past two decades due to ...
The recent development of low dislocation density Aluminum Nitride (AlN) substrates allows the reali...
The AlxIn1-xN barrier high electron mobility transistor (HEMT) structure has been optimized with var...
A1. X-ray diffraction A1. Transmission electron microscopy A3. Molecular beam epitaxy B3. High elect...
AlN/GaN high electron mobility transistor (HEMT) structures with a 3.5 nm AlN barrier were grown wit...