The industrial level technologies including molecular beam epitaxy and submicron planar processing are developed to realize novel electron devices based on III-nitride multilayer heterostructures. Wide conditions range available on growth equipment used as well as flexible heterostructure designs allows controlling of device oriented material properties. For microwave applications, thick AlN “templates ” grown at extremely high (up to 1100°C) substrate temperature in conjunction with multilayer transition region design both provide low dislocation density in the order of 108 cm-2. The strong carrier confinement in two-dimensional electron gas for collapse-free transistor operation is provided by placing GaN channel between AlGaN barriers of...
The fabrication processes development for on III-nitride (III-N) heterojunction bipolar transistors ...
In the past decades, III-nitride semiconductor compounds have attracted an increasing amount of inte...
Gallium nitride based High Electron Mobility Transistors (HEMT) with ultra-thin AlN barriers are dev...
185 pagesGallium nitride high-electron-mobility transistors (GaN HEMTs) are at a point of rapid grow...
Aluminum nitride (AlN) has subjected adjoin in formation of state-of-the-art high-current p-channel ...
The III-nitride materials, consisting of Al, Ga, In and N, have several physical properties that mak...
This thesis focuses on III-Nitrides for electronic and gas sensing devices. Systematic material grow...
III-nitride electron devices are attracting considerable attention for wireless communication equipm...
III-Nitride (III-N) semiconductors with wide bandgap (WBG) characteristics offer promising advanceme...
III-Nitride (III-N) semiconductors with wide bandgap (WBG) characteristics offer promising advanceme...
The III-nitride semiconductor materials have wide direct bandgap ranging from 6.2 eV (AlN); through ...
The III-nitride semiconductor materials have wide direct bandgap ranging from 6.2 eV (AlN); through ...
In this chapter, the different growth techniques of plasma‐assisted molecular beam epitaxy (PAMBE) a...
The III-Nitrides were intensively studied during the last few years due to its tunable band gap rang...
Gallium nitride (GaN) based technology has been heavily researched over the past two decades due to ...
The fabrication processes development for on III-nitride (III-N) heterojunction bipolar transistors ...
In the past decades, III-nitride semiconductor compounds have attracted an increasing amount of inte...
Gallium nitride based High Electron Mobility Transistors (HEMT) with ultra-thin AlN barriers are dev...
185 pagesGallium nitride high-electron-mobility transistors (GaN HEMTs) are at a point of rapid grow...
Aluminum nitride (AlN) has subjected adjoin in formation of state-of-the-art high-current p-channel ...
The III-nitride materials, consisting of Al, Ga, In and N, have several physical properties that mak...
This thesis focuses on III-Nitrides for electronic and gas sensing devices. Systematic material grow...
III-nitride electron devices are attracting considerable attention for wireless communication equipm...
III-Nitride (III-N) semiconductors with wide bandgap (WBG) characteristics offer promising advanceme...
III-Nitride (III-N) semiconductors with wide bandgap (WBG) characteristics offer promising advanceme...
The III-nitride semiconductor materials have wide direct bandgap ranging from 6.2 eV (AlN); through ...
The III-nitride semiconductor materials have wide direct bandgap ranging from 6.2 eV (AlN); through ...
In this chapter, the different growth techniques of plasma‐assisted molecular beam epitaxy (PAMBE) a...
The III-Nitrides were intensively studied during the last few years due to its tunable band gap rang...
Gallium nitride (GaN) based technology has been heavily researched over the past two decades due to ...
The fabrication processes development for on III-nitride (III-N) heterojunction bipolar transistors ...
In the past decades, III-nitride semiconductor compounds have attracted an increasing amount of inte...
Gallium nitride based High Electron Mobility Transistors (HEMT) with ultra-thin AlN barriers are dev...