Measurements of a low-temperature mechanical dissipation peak in a single layer of $Ta_2O_5$ doped with $TiO_2$
- Martin, I.
- Armandula, H.
- Comtet, C.
- Fejer, M.M.
- Gretarsson, A.
- Harry, G.
- Hough, J.
- Mackowski, J.-M.
- Maclaren, I.
- Michel, Christine
- Montorio, J.-L.
- Morgado, N.
- Nawrodt, R.
- Penn, S.
- Reid, S.
- Remillieux, A.
- Route, R.
- Rowan, S.
- Schwarz, C.
- Seidel, P.
- Vodel, W.
- Zimmer, A.
DOIAbstract
Thermal noise arising from mechanical dissipation in oxide coatings is a major limitation to many precision measurement systems, including optical frequency standards, high-resolution optical spectroscopy and interferometric gravity wave detectors. Presented here are measurements of dissipation as a function of temperature between 7 K and 290 K in ion-beam-sputtered Ta2O5 doped with TiO2, showing a loss peak at 20 K. Analysis of the peak provides the first evidence of the source of dissipation in doped Ta2O5 coatings, leading to possibilities for the reduction of thermal noise effects
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