Piezoelectric actuators (PEAs) are frequently used in a wide variety of micromanipulation systems. However, the hysteresis non-linearity and the creep reduce their fidelity and cause difficulties in the micromanipulation control procedure. Besides, variation of temperature and external loads could change the model parameters identified for the piezo actuator. In this paper, a robust feedforward–feedback controller is proposed for precise tracking control of PEAs, under external disturbances. A Bouc–Wen hysteresis model is integrated with a second-order linear dynamic, to represent the behaviour of a PEA. Based on the Bouc–Wen model, a hysteresis observer is developed to estimate the hysteresis non-linear effect. Then, for real-time compensa...
Piezoelectric actuators (PEAs) utilize the inverse piezoelectric effect to generate fine displacemen...
Based on the background of atomic force microscope (AFM) driven by piezoelectric actuators (PEAs), t...
Based on the background of atomic force microscope (AFM) driven by piezoelectric actuators (PEAs), t...
Piezoelectric actuators (PEAs) are frequently used in a wide variety of micromanipulation systems. H...
Piezoelectric actuators (PEAs) are frequently used in a wide variety of micromanipulation systems. H...
Piezoelectric actuators (PEAs) are frequently used in a wide variety of micromanipulation systems. H...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
The problem of tracking control for piezoelectric actuator (PEA) is investigated in this article. In...
Piezoelectric actuators (PEAs) utilize the inverse piezoelectric effect to generate fine displacemen...
Based on the background of atomic force microscope (AFM) driven by piezoelectric actuators (PEAs), t...
Based on the background of atomic force microscope (AFM) driven by piezoelectric actuators (PEAs), t...
Piezoelectric actuators (PEAs) are frequently used in a wide variety of micromanipulation systems. H...
Piezoelectric actuators (PEAs) are frequently used in a wide variety of micromanipulation systems. H...
Piezoelectric actuators (PEAs) are frequently used in a wide variety of micromanipulation systems. H...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
In this paper, a robust control approach using a novel hysteresis observer is developed for precise ...
The problem of tracking control for piezoelectric actuator (PEA) is investigated in this article. In...
Piezoelectric actuators (PEAs) utilize the inverse piezoelectric effect to generate fine displacemen...
Based on the background of atomic force microscope (AFM) driven by piezoelectric actuators (PEAs), t...
Based on the background of atomic force microscope (AFM) driven by piezoelectric actuators (PEAs), t...