Depth profile determination of extremely diluted polarized ions implanted in metals

A direct method for the determination of the depth profile of implanted polarized probes is described. It has been applied to measure the depth profile of B-12 nuclei implanted at an atomic concentration of 10(-16) in polycrystalline gold. The results prove the ability of this method to measure the depth distribution of implanted nuclei with an unknown energy distribution, which is typical for a polarized beam emerging from a succession of nuclear reactions or electromagnetic interactions