Undoped and nitrogen-doped amorphous carbon (ta-C) films deposited using a filtered cathodic vacuum arc were investigated by high-resolution electron energy-loss spectroscopy in transmission. The carbon and nitrogen K-edge spectra show fine structure at the C 1s to π* excitations which gives information about the hybridization and coordination of the carbon and nitrogen atoms. The loss data were collected up to 50 eV and a Kramers-Kronig analysis was used to derive their complex dielectric functions. The ε2 spectra show two features due to excitations of π and σ valence states. The π feature is very small in ta-C deposited at 100 eV, consistent with its high sp3 content. The development of the π and σ peaks with varying sp2 content and thei...
The influence of substrate bias and hydrogen/nitrogen incorporation on the optical properties [studi...
The effect of substrate bias on X-ray photoelectron spectroscopy (XPS) study of nitrogen incorporate...
Microstructural properties of ultrathin (1-10 nm) tetrahedral amorphous carbon (ta-C) films are inve...
Tetrahedrally bonded amorphous carbon (ta-C) and nitrogen doped (ta-C:N) films were obtained at room...
Surface and bulk properties of the Filtered Cathodic Vacuum Arc prepared nitrogenated tetrahedral am...
Surface and bulk properties of the Filtered Cathodic Vacuum Arc prepared nitrogenated tetrahedral am...
Tetrahedral amorphous carbon (ta-C) thin films were deposited using both the filtered cathodic vacuu...
Structural changes induced by the incorporation of nitrogen into ta-C : H films have been studied by...
The properties of a highly sp3 bonded form of amorphous carbon denoted ta-C deposited from a filtere...
Studied on the electronic properties of tetrahedral amorphous carbon thin films deposited by filtere...
The application of a sufficiently high negative substrate bias, during the growth of tetrahedral amo...
The study of reflectance and photoluminescence (PL) spectra of as grown and also hydrogen and nitrog...
This article reports the field emission measurements on as grown tetrahedral amorphous carbon (ta-C)...
The field emission behaviour of a series of Tetrahedrally Bonded Amorphous Carbon (ta-C) films has b...
Amorphous carbon (a-C) films grow via energetic processes such as pulsed-laser deposition (PLD). The...
The influence of substrate bias and hydrogen/nitrogen incorporation on the optical properties [studi...
The effect of substrate bias on X-ray photoelectron spectroscopy (XPS) study of nitrogen incorporate...
Microstructural properties of ultrathin (1-10 nm) tetrahedral amorphous carbon (ta-C) films are inve...
Tetrahedrally bonded amorphous carbon (ta-C) and nitrogen doped (ta-C:N) films were obtained at room...
Surface and bulk properties of the Filtered Cathodic Vacuum Arc prepared nitrogenated tetrahedral am...
Surface and bulk properties of the Filtered Cathodic Vacuum Arc prepared nitrogenated tetrahedral am...
Tetrahedral amorphous carbon (ta-C) thin films were deposited using both the filtered cathodic vacuu...
Structural changes induced by the incorporation of nitrogen into ta-C : H films have been studied by...
The properties of a highly sp3 bonded form of amorphous carbon denoted ta-C deposited from a filtere...
Studied on the electronic properties of tetrahedral amorphous carbon thin films deposited by filtere...
The application of a sufficiently high negative substrate bias, during the growth of tetrahedral amo...
The study of reflectance and photoluminescence (PL) spectra of as grown and also hydrogen and nitrog...
This article reports the field emission measurements on as grown tetrahedral amorphous carbon (ta-C)...
The field emission behaviour of a series of Tetrahedrally Bonded Amorphous Carbon (ta-C) films has b...
Amorphous carbon (a-C) films grow via energetic processes such as pulsed-laser deposition (PLD). The...
The influence of substrate bias and hydrogen/nitrogen incorporation on the optical properties [studi...
The effect of substrate bias on X-ray photoelectron spectroscopy (XPS) study of nitrogen incorporate...
Microstructural properties of ultrathin (1-10 nm) tetrahedral amorphous carbon (ta-C) films are inve...