To provide structural and diffraction criteria for the identification of trans-vacant (tv) and cis-vacant (cv) mica varieties with different layer stackings, powder X-ray diffraction (XRD) patterns have been simulated for 1M, 2M, 2M, 3T and 2O structural models consisting of either tv or cv layers. The differences in the unit-cell parameters resulting from the specific structural distortions of tv and cv layers lead to the differences in the positions of reflections having the same indices in the XRD patterns for tv and cv 1M, 2M and 2M mica varieties. The tv 1M, 2M and 2M varieties of Al-rich micas can therefore be distinguished from the corresponding cv varieties using powder XRD diffraction provided that the d values are measured with hi...